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PhaseCam dynamic Twyman-Green interferometers provide high resolution measurements that are insensitive to vibration and air turbulence. PhaseCams capture full wavefront measurements in as little as 30 microseconds—5000 times faster than conventional phase shifting interferometers. (read more)
Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources
Search by Specification | Learn MoreSemiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
Search by Specification | Learn MoreInfrared (IR) spectrometers measure the wavelength and intensity of the absorption of infrared light by a sample.
Search by Specification | Learn MorePolarimeters determine the amount of polarization of light.
Learn MoreWafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Search by Specification | Learn MoreLinear velocity sensors measure the linear velocity of an object using either contact or non-contact techniques.
Search by Specification | Learn MoreOptical flats or test plates are polished surfaces that are used as references against the flatness of unknown surfaces for comparison. They use the property of interference to measure the flatness of a test surface.
Search by Specification | Learn MoreNDT supplies and accessories are components, ancillary equipment, standards, and consumable materials used in non-destructive testing (NDT).
Search by Specification | Learn MoreOptical spectrum analyzers (OSA) can divide a lightwave signal into its constituent wavelengths. This means that it is possible to see the spectral profile of the signal over a certain wavelength range.
Search by Specification | Learn MoreOptical bandpass filters are designed to transmit a specific waveband. They are composed of many thin layers of dielectric materials, which have differing refractive indices to produce constructive and destructive interference in the transmitted light.
Search by Specification | Learn MoreMirror mounts are used to hold and support mirrors of all sizes and shapes.
Learn MoreCollimators are optical lens assemblies that take divergent or convergent incoming light rays and produces parallel light output.
Learn MoreOptical rails and bases mount to optical tables to support components and instruments in a straight line, while retaining the freedom to quickly change their relative spacing.
Learn MoreOptical and optoelectronic design services assist with the initial conception and design of an optical or optoelectronic device or assembly.
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FizCam 3000 Fizeau Dynamic Laser Interferometer 4D Technology Corporation
4D Technology Upgrade Kits 4D Technology Corporation
PhaseCam Twyman-Green Interferometers 4D Technology Corporation
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The WaveCam 1000 is designed to test the next generation of CD, Blu-ray and DVD pickup heads. The WaveCam incorporates a single frame, dynamic phase sensor that makes measurements in tens of microseconds and works equally well with pulsed or CW sources. (read more)
PhaseCam dynamic Twyman-Green interferometers provide high resolution measurements that are insensitive to vibration and air turbulence. PhaseCams capture full wavefront measurements in as little as 30 microseconds—5000 times faster than conventional phase shifting interferometers. (read more)
PhaseCam® NIR dynamic laser interferometers accurately measure surface shape and wavefront quality at 1.053, 1.064, 1.3 and 1.55 micron wavelengths. PhaseCam laser interferometers acquire measurement data in less than 30 us, making them insensitive to vibration and air turbulence. Applications include measurement of optics for astronomy, surveillance, guidance and directed energy. (read more)
The FizCam 2000 Fizeau interferometer combines vibration tolerance, instantaneous phase measurement, the ability to isolate surfaces, and the ability to measure remote and solid cavities, for highly accurate characterization of telescope optics, general-purpose optics and prisms. (read more)
The FizCam 3000 is an entirely new Fizeau design, providing highly accurate measurement of optical grade surfaces even in the presence of vibration and air turbulence. Its completely on-axis design eliminates the inherent aberrations, software corrections and painstaking calibrations and alignments typical of tilted beam Fizeau systems. (read more)
The DiskCam 2000 dynamic Fizeau interferometer provides high accuracy measurement of polished aluminum and glass disks/ media, even in the presence of vibration and air turbulence. Featuring a proprietary laser source, the system enables measurement of both sides of uncoated glass disks in a single setup, without the need for extraneous coatings to control multiple interference fringes. (read more)
The SpeckleCam Electronic Speckle Pattern Interferometer (ESPI) measures the change in shape of structures with diffuse surfaces. Its patented, single camera pixelated sensor enables high spatial sampling. (read more)
Innovative RLE10 and RLE20 fiber-optic laser encoders convert the laser interferometer from a complex scientific instrument into a simple production solution to ultra-precise process control, enabling picometer resolution, differential measurement, and part-per-billion laser frequency stability. (read more)
The Lapmaster/LAMTech TOPOS and SPI series of Interferometers feature Grazing Incidence flatness inspection and measurement capability for grinding, lapping & polishing applications. The need to generate a polished surface, strictly for optical flatness measurement, is eliminated with the use of these systems. Ground surfaces, matte surfaces and polsihed surfaces can all be measured. (read more)
Non-contact displacement and vibration sensor capable of ultra-high resolution of 0.08nm with high speed response. (read more)
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Ernst Mach - Wikipedia, the free encyclopedia The Mach-Zehnder interferometer is named after his son Ludwig Mach, who was also a physicist. |
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Distributed fiber-optic sensor with a ring Mach-Zehnder... Distributed fiber-optic sensor with a ring Mach-Zehnder interferometer (Proceedings Paper) See International Society for Optical Engineering (The) Information |
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Nested-ring Mach-Zehnder interferometer in... Nested-ring Mach-Zehnder interferometer in silicon-on-insulator (Proceedings Paper) See International Society for Optical Engineering (The) Information |
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LIGOLASERINTERFEROMETERGRAVITATIONALWAVEOBSERVATORY LIGO... Collaboration LIGO?T040119?00?R ADVANCED LIGO 06/01/04 Mach-Zehnder interferometer for Advanced-LIGO optical configurations to eliminate sidebands of |
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Polymeric Mach-Zehnder interferometer using serially coupled... Polymeric Mach-Zehnder interferometer using serially coupled microring resonators |
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Welcome to NTT Electronics -PLC Mach-Zehnder Interferometer- PLC Mach-Zehnder Interferometer Stable and reliable Mach-Zehnder interferometer based on silica-based planar lightwave circuit. See NTT Electronics Corporation (NEL) Information |
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CiteULike: kristgy's mach-zehnder [9 articles protein interaction by a highly sensitive integrated optical Mach-Zehnder interferometer on silicon |
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CiteULike: Phase Sensitivity of a Mach-Zehnder Interferometer Phase Sensitivity of a Mach-Zehnder Interferometer |
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History of Optics L Mach and L Zehnder separately described what has become known as the Mach-Zehnder interferometer which could monitor changes in refractive index, |
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Mach-Zehnder Interferometer Mach-Zehnder Interferometer Click here to go to the Physics Virtual Bookshelf. |