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Product Categories for roundness measuring interferometer
Interferometers - (92 companies)
Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources Search by Specification | Learn more about Interferometers

Semiconductor Metrology Instruments - (113 companies)
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   Search by Specification | Learn more about Semiconductor Metrology Instruments

Form Gages and Form Gaging Systems - (44 companies)
Form gages and form gaging systems are used to inspect parameters such as roundness, angularity, squareness, straightness, flatness, runout, taper and concentricity.  Search by Specification | Learn more about Form Gages and Form Gaging Systems

Coordinate Measuring Machines (CMM - (141 companies)
Coordinate measuring machines (CMMs) are mechanical systems designed to move a measuring probe to determine the coordinates of points on a work piece surface Search by Specification | Learn more about Coordinate Measuring Machines (CMM

Measuring Microscopes - (65 companies)
Measuring microscopes are used by toolmakers for measuring the properties of tools.  These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view Search by Specification | Learn more about Measuring Microscopes

Surface Tension Measuring Instruments - (46 companies)
Surface tension measuring instruments measure fluid surface tension, a tangential force that keeps a fluid together at the air/fluid interface. Surface tension is a direct indicator of the quality of any chemical and any formulation Learn more about Surface Tension Measuring Instruments

Surface Metrology Equipment - (174 companies)
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects Search by Specification | Learn more about Surface Metrology Equipment

Dimensional and Profile Scanners - (203 companies)
Dimensional and profile scanners gather two-dimensional (2D) or three-dimensional (3D) information about an object. Search by Specification | Learn more about Dimensional and Profile Scanners

KVA Meters - (31 companies)
KVA meters measure the apparent power of AC devices in kilovolt-amperes (KVA). Apparent power is the combination of a circuit’s true power and reactive power Search by Specification | Learn more about KVA Meters

Rules and Scales - (147 companies)
Rules are flat, graduated scales used for length measurement.  For OEM applications, digital or electronic linear scales are often used. Search by Specification | Learn more about Rules and Scales

Humidity Measurement Instruments - (409 companies)
Humidity measurement instruments test for absolute humidity, relative humidity, or dew point in air. Search by Specification | Learn more about Humidity Measurement Instruments

Dimensional Gages and Instruments - (853 companies)
Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore. Search by Specification | Learn more about Dimensional Gages and Instruments

Dimensional Measurement and Metrology Services - (127 companies)
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry Learn more about Dimensional Measurement and Metrology Services

Specialty Dimensional Gages and Systems - (174 companies)
Specialty or proprietary gages, instruments or gaging systems for dimensional measurement. Learn more about Specialty Dimensional Gages and Systems

Fixed Gages - (52 companies)
Fixed gages are designed to access a specific attribute based on comparative gaging. Learn more about Fixed Gages


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See more product announcements for Interferometers
FizCam 2000 Dynamic Fizeau Laser Interferometer

FizCam 2000 Dynamic Fizeau Laser Interferometer
4D Technology Corporation


Custom Interferometers

Custom Interferometers
Canon USA Encoders/Optoelectronic Components Group


PhaseCam NIR Twyman-Green Interferometers

PhaseCam NIR Twyman-Green Interferometers
4D Technology Corporation


11 See more product announcements for Interferometers

Product Announcements for roundness measuring interferometer

Product Announcements: 1 - 10 of 2691
Lapmaster International - Interferometer Flatness Measuring
Lapmaster International
Interferometer Flatness Measuring

The Lapmaster/LAMTech TOPOS and SPI series of Interferometers feature Grazing Incidence flatness inspection and measurement capability for grinding, lapping & polishing applications. The need to generate a polished surface, strictly for optical flatness measurement, is eliminated with the use of these systems. Ground surfaces, matte surfaces and polsihed surfaces can all be measured. (read more)

More product announcements from Lapmaster International
Browse Lapmaster International Catalog
4D Technology Corporation - PhaseCam NIR Twyman-Green Interferometers
4D Technology Corporation
PhaseCam NIR Twyman-Green Interferometers

PhaseCam® NIR dynamic laser interferometers accurately measure surface shape and wavefront quality at 1.053, 1.064, 1.3 and 1.55 micron wavelengths. PhaseCam laser interferometers acquire measurement data in less than 30 us, making them insensitive to vibration and air turbulence. Applications include measurement of optics for astronomy, surveillance, guidance and directed energy. (read more)

More product announcements from 4D Technology Corporation
Browse 4D Technology Corporation Catalog
4D Technology Corporation - FizCam 2000 Dynamic Fizeau Laser Interferometer
4D Technology Corporation
FizCam 2000 Dynamic Fizeau Laser Interferometer

The FizCam 2000 Fizeau interferometer combines vibration tolerance, instantaneous phase measurement, the ability to isolate surfaces, and the ability to measure remote and solid cavities, for highly accurate characterization of telescope optics, general-purpose optics and prisms. (read more)

More product announcements from 4D Technology Corporation
Browse 4D Technology Corporation Catalog
Pratt & Whitney Measurement Systems, Inc. - Laseruler® for Vertical Measuring
Pratt & Whitney Measurement Systems, Inc.
Laseruler® for Vertical Measuring

Your solution for vertical measuring is the Laseruler® which is laser-interferometer-based for very high accuracy. Our exclusive digital interferometer measures the dimension of the part by comparing the measurement probe position to the wavelength of a HeNe laser light source, effectively coupling the wavelength of light to the part being measured. (read more)

More product announcements from Pratt & Whitney Measurement Systems, Inc.
Browse Pratt & Whitney Measurement Systems, Inc. Catalog
Browse Calibration Instruments Datasheets for Pratt & Whitney Measurement Systems, Inc.
4D Technology Corporation - WaveCam 1000 Laser Interferometer
4D Technology Corporation
WaveCam 1000 Laser Interferometer

The WaveCam 1000 is designed to test the next generation of CD, Blu-ray and DVD pickup heads. The WaveCam incorporates a single frame, dynamic phase sensor that makes measurements in tens of microseconds and works equally well with pulsed or CW sources. (read more)

More product announcements from 4D Technology Corporation
Browse 4D Technology Corporation Catalog
4D Technology Corporation - FizCam 3000 Fizeau Dynamic Laser Interferometer
4D Technology Corporation
FizCam 3000 Fizeau Dynamic Laser Interferometer

The FizCam 3000 is an entirely new Fizeau design, providing highly accurate measurement of optical grade surfaces even in the presence of vibration and air turbulence. Its completely on-axis design eliminates the inherent aberrations, software corrections and painstaking calibrations and alignments typical of tilted beam Fizeau systems. (read more)

More product announcements from 4D Technology Corporation
Browse 4D Technology Corporation Catalog
4D Technology Corporation - DiskCam 2000 Dynamic Fizeau Interferometer
4D Technology Corporation
DiskCam 2000 Dynamic Fizeau Interferometer

The DiskCam 2000 dynamic Fizeau interferometer provides high accuracy measurement of polished aluminum and glass disks/ media, even in the presence of vibration and air turbulence. Featuring a proprietary laser source, the system enables measurement of both sides of uncoated glass disks in a single setup, without the need for extraneous coatings to control multiple interference fringes. (read more)

More product announcements from 4D Technology Corporation
Browse 4D Technology Corporation Catalog
Renishaw - Interferometer Encoder for Picometer Positioning
Renishaw
Interferometer Encoder for Picometer Positioning

Innovative RLE10 and RLE20 fiber-optic laser encoders convert the laser interferometer from a complex scientific instrument into a simple production solution to ultra-precise process control, enabling picometer resolution, differential measurement, and part-per-billion laser frequency stability. (read more)

More product announcements from Renishaw
Browse Renishaw Catalog
Browse Interferometers Datasheets for Renishaw
Canon USA Encoders/Optoelectronic Components Group - Micro Laser Interferometer
Canon USA Encoders/Optoelectronic Components Group
Micro Laser Interferometer

Non-contact displacement and vibration sensor capable of ultra-high resolution of 0.08nm with high speed response. (read more)

More product announcements from Canon USA Encoders/Optoelectronic Components Group
Browse Canon USA Encoders/Optoelectronic Components Group Catalog
Browse Interferometers Datasheets for Canon USA Encoders/Optoelectronic Components Group
Pratt & Whitney Measurement Systems, Inc. -  Laser Measuring Machine - Long Length External
Pratt & Whitney Measurement Systems, Inc.
Laser Measuring Machine - Long Length External

Long Length Measuring Machines are offered in standard lengths to 3 meters (120 inches) available with either our Electrolimit or laser based transducer, both easily measuring length, diameter, pitch diameter, roundness, parallelism and taper. (read more)

More product announcements from Pratt & Whitney Measurement Systems, Inc.
Browse Pratt & Whitney Measurement Systems, Inc. Catalog
Browse Calibration Instruments Datasheets for Pratt & Whitney Measurement Systems, Inc.

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Tools & Useful Links for roundness measuring interferometer

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Engineering Web: roundness measuring interferometer 1 - 10 of 2,795
Length Measuring Instruments - Taylor Hobson - Length...
Roundness Measuring Instruments Length Measuring Instruments
See Taylor Hobson Precision Information
SBI - Taylor Hobson - SBI
General Roundness and Surface Courses Run to give you an insight into the measurement of surface finish and roundness.
See Taylor Hobson Precision Information
Roundness and Cylindrical Profile Measuring Instruments |...
Home > Products > Measuring Systems > Roundness and Cylindrical Profile Measuring Instruments
See Tokyo Seimitsu Co., Ltd. Information
Laser Interferometer / Built-in Measuring Instruments |...
Home > Products > Measuring Systems > Laser Interferometer / Built-in Measuring Instruments Laser Interferometer / Built-in Measuring Instruments
See Tokyo Seimitsu Co., Ltd. Information
NIST Calibration Services: Diameter Measurements
of thread and gear measuring wires by either comparison to NIST master wires or absolute calibration with a laser-interferometer-based micrometer.
Dimensional Metrology
the phase measuring and displacement measuring interferometers of X-Ray Calibration Interferometer (XCALIBIR), the Geometry Measuring Machine (GEMM),
Sub-nanometer interferometry for industrial high-precision...
able to detect a passing gravitational wave by measuring the change in the length of the interferometer arms.
See International Society for Optical Engineering (The) Information
Roundness and Cylindrical Profile Measuring Instruments:...
Laser Interferometer / Built-in Measuring Instruments Roundness and Cylindrical Profile Measuring Instruments
See Accretech USA Information
Measuring Systems
Laser Interferometer / Built-in Measuring Instruments Roundness and Cylindrical Profile Measuring Instruments
See Accretech USA Information
Interferometric measuring system invention
[0001 The present invention relates to an interferometric measuring system for measuring, for example, shape deviation, position, surface


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Related Keywords
Sagnac interferometer, Sagnac interferometry, scalar instrument, scalar interferometer, scalar interferometry

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