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Product Categories for roundness measuring interferometer
Interferometers -
(92 companies)
Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources
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Semiconductor Metrology Instruments -
(113 companies)
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
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Form Gages and Form Gaging Systems -
(44 companies)
Form gages and form gaging systems are used to inspect parameters such as roundness, angularity, squareness, straightness, flatness, runout, taper and concentricity. 
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Coordinate Measuring Machines (CMM -
(141 companies)
Coordinate measuring machines (CMMs) are mechanical systems designed to move a measuring probe to determine the coordinates of points on a work piece surface
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Measuring Microscopes -
(65 companies)
Measuring microscopes are used by toolmakers for measuring the properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view
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Surface Tension Measuring Instruments -
(46 companies)
Surface tension measuring instruments measure fluid surface tension, a tangential force that keeps a fluid together at the air/fluid interface. Surface tension is a direct indicator of the quality of any chemical and any formulation
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Surface Metrology Equipment -
(174 companies)
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects
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Dimensional and Profile Scanners -
(203 companies)
Dimensional and profile scanners gather two-dimensional (2D) or three-dimensional (3D) information about an object.
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KVA Meters -
(31 companies)
KVA meters measure the apparent power of AC devices in kilovolt-amperes (KVA). Apparent power is the combination of a circuit’s true power and reactive power
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Rules and Scales -
(147 companies)
Rules are flat, graduated scales used for length measurement. For OEM applications, digital or electronic linear scales are often used.
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Humidity Measurement Instruments -
(409 companies)
Humidity measurement instruments test for absolute humidity, relative humidity, or dew point in air.
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Dimensional Gages and Instruments -
(853 companies)
Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore.
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Dimensional Measurement and Metrology Services -
(127 companies)
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry
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Specialty Dimensional Gages and Systems -
(174 companies)
Specialty or proprietary gages, instruments or gaging systems for dimensional measurement.
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Fixed Gages -
(52 companies)
Fixed gages are designed to access a specific attribute based on comparative gaging.
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Product Announcements for roundness measuring interferometer
Product Announcements: 1 - 10 of 2691
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Lapmaster International
Interferometer Flatness Measuring
The Lapmaster/LAMTech TOPOS and SPI series of Interferometers feature Grazing Incidence flatness inspection and measurement capability for grinding, lapping & polishing applications. The need to generate a polished surface, strictly for optical flatness measurement, is eliminated with the use of these systems. Ground surfaces, matte surfaces and polsihed surfaces can all be measured.
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4D Technology Corporation
PhaseCam NIR Twyman-Green Interferometers
PhaseCam® NIR dynamic laser interferometers accurately measure surface shape and wavefront quality at 1.053, 1.064, 1.3 and 1.55 micron wavelengths. PhaseCam laser interferometers acquire measurement data in less than 30 us, making them insensitive to vibration and air turbulence. Applications include measurement of optics for astronomy, surveillance, guidance and directed energy.
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4D Technology Corporation
FizCam 2000 Dynamic Fizeau Laser Interferometer
The FizCam 2000 Fizeau interferometer combines vibration tolerance, instantaneous phase measurement, the ability to isolate surfaces, and the ability to measure remote and solid cavities, for highly accurate characterization of telescope optics, general-purpose optics and prisms.
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Pratt & Whitney Measurement Systems, Inc.
Laseruler® for Vertical Measuring
Your solution for vertical measuring is the Laseruler® which is laser-interferometer-based for very high accuracy. Our exclusive digital interferometer measures the dimension of the part by comparing the measurement probe position to the wavelength of a HeNe laser light source, effectively coupling the wavelength of light to the part being measured.
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4D Technology Corporation
WaveCam 1000 Laser Interferometer
The WaveCam 1000 is designed to test the next generation of CD, Blu-ray and DVD pickup heads. The WaveCam incorporates a single frame, dynamic phase sensor that makes measurements in tens of microseconds and works equally well with pulsed or CW sources.
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4D Technology Corporation
FizCam 3000 Fizeau Dynamic Laser Interferometer
The FizCam 3000 is an entirely new Fizeau design, providing
highly accurate measurement of optical grade surfaces even in the presence of
vibration and air turbulence. Its completely on-axis design eliminates the inherent
aberrations, software corrections and painstaking calibrations and alignments
typical of tilted beam Fizeau systems.
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4D Technology Corporation
DiskCam 2000 Dynamic Fizeau Interferometer
The DiskCam 2000 dynamic Fizeau interferometer provides high accuracy measurement of polished aluminum and glass disks/ media, even in the presence of vibration and air turbulence. Featuring a proprietary laser source, the system enables measurement of both sides of uncoated glass disks in a single setup, without the need for extraneous coatings to control multiple interference fringes.
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Renishaw
Interferometer Encoder for Picometer Positioning
Innovative RLE10 and RLE20 fiber-optic laser encoders convert the laser interferometer from a complex scientific instrument into a simple production solution to ultra-precise process control, enabling picometer resolution, differential measurement, and part-per-billion laser frequency stability.
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Canon USA Encoders/Optoelectronic Components Group
Micro Laser Interferometer
Non-contact displacement and vibration sensor capable of ultra-high resolution of 0.08nm with high speed response.
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Pratt & Whitney Measurement Systems, Inc.
Laser Measuring Machine - Long Length External
Long Length Measuring Machines are offered in standard lengths to 3 meters (120 inches) available with either our Electrolimit or laser based transducer, both easily measuring length, diameter, pitch diameter, roundness, parallelism and taper.
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