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4D Technology announces a new line of optical mounting components for use with large aperture laser interferometers. 4D mounts greatly improve the measurement quality of laser interferometers, which is frequently compromised by inferior mounting components and ad hoc mounting configurations. (read more)
Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources.
Search by Specification | Learn MoreDimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry.
Learn MoreMaterial testing services test, analyze, and certify a wide range of materials for purity, chemical compatibility, and environmental impact.
Search by Specification | Learn MoreBalls and sphere shapes are used for check or ball valves, bearings, or other applications requiring a spherical product. They are fabricated from materials such as carbides, ceramics, sapphire, metals, plastics, rubber and elastomers.
Search by Specification | Learn MoreProperty testers are used to determine various physical properties of samples, including distillation, vapor pressure, and cloud, flash, freezing, melting, or pour point.
Search by Specification | Learn MoreNon-destructive testing (NDT) equipment is used to detect, inspect, and measure flaws, bond integrity, and other material conditions without permanently altering or destroying the examined part or product.
Search by Specification | Learn MoreSpecialty or proprietary gages, instruments or gaging systems for dimensional measurement.
Learn MoreStrain gauges are measuring elements that convert force, pressure, tension, etc., into an electrical signal.
Search by Specification | Learn MoreNon-destructive testing (NDT) material testers are devices, machines and equipment that are used to determine residual stress, alloy type, hardness, microstructure, elasticity, heat treatment and other material conditions without permanently altering or destroying the material being examined.
Search by Specification | Learn MoreSpecialty nondestructive testing (NDT) probes and sensors are specialized or proprietary devices for NDT.
Learn MoreNon-destructive testing (NDT) services use test methods to examine an object, material or system without impairing its future usefulness.
Search by Specification | Learn MoreSurface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
Search by Specification | Learn MoreThickness gages are used to make precise dimensional measurements on a wide variety of coatings and materials including steel, plastic, glass, rubber, ceramics, paint, electroplated layers, enamels, etc
Search by Specification | Learn MoreCorrosion and electrochemical instruments use a variety of methods to detect and measure corrosion and electrochemical conditions in plant machinery, field equipment, batteries, fuel cells, colloids, and other solutions or systems.
Search by Specification | Learn MoreOptical flats or test plates are polished surfaces that are used as references against the flatness of unknown surfaces for comparison. They use the property of interference to measure the flatness of a test surface.
Search by Specification | Learn More|
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4D Optical Mounting Components 4D Technology Corporation
4D Technology Upgrade Kits 4D Technology Corporation
PhaseCam NIR Twyman-Green Interferometers 4D Technology Corporation
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Engineered Surface Finishes now offers patented Subaperture Stitching Interferometry Services (SSI®) to meet your large clear aperture and high numerical aperture interferometry needs. Precise measurement of parts up to 200 mm in diameter in shapes ranging from flats to hemispheres. (read more)
The Wyko NT9300 utilizes Veeco's ninth-generation optical profiling sensor technology to provide fast, highly accurate 3D surface topography measurements from 0.1 nanometer up to 10 millimeters. The extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples. (read more)
The Lapmaster/LAMTech TOPOS and SPI series of Interferometers feature Grazing Incidence flatness inspection and measurement capability for grinding, lapping & polishing applications. The need to generate a polished surface, strictly for optical flatness measurement, is eliminated with the use of these systems. Ground surfaces, matte surfaces and polsihed surfaces can all be measured. (read more)
The Wyko NT9800 Optical Profiler delivers rapid, non-contact, 3D measurements from 0.1 nanometer up to 10 millimeters, with sub-nanometer resolution. (read more)
PhaseCam® NIR dynamic laser interferometers accurately measure surface shape and wavefront quality at 1.053, 1.064, 1.3 and 1.55 micron wavelengths. PhaseCam laser interferometers acquire measurement data in less than 30 us, making them insensitive to vibration and air turbulence. Applications include measurement of optics for astronomy, surveillance, guidance and directed energy. (read more)
Power Technology, Inc. proudly unveils one of its highest power violet laser modules to date. The new microprocessor controlled Instrument Quality (IQµ) module emits 400mW of violet output at 405 ± 5nm. This unique development in laser diode technology represents a significant increase in power over the company's popular 200mW version. (read more)
Power Technology, Inc. has introduced its much anticipated IQµ (Instrument Quality – Microprocessor controlled) laser module. The microprocessor controlled module offers precise control over crucial operating parameters by two methods: an on-board, menu driven, local control or a Windows compatible control and monitoring software via USB (Universal Serial Bus) or an RS-232 interface. The module is... (read more)
Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. (read more)
Tungsten carbide rings for seals are made with extreme care. After lapping, each part is checked for flatness by interferometry. Attainable flatness is .001 mm. (read more)
Since 1980, ARW Optical has manufactured precision cylindrical lenses for both R&D and Commercial applications. Our ability to provide both rapid prototyping and volume production has made us a choice manufacturer. All our lenses are manufactured to your exact specifications and tested using interferometry.
high-quality custom cylindrical lenses for all UV-IR applications prototyping ... (read more)
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Flatness, Radius and Sphericity Calibration Services :... Flatness, Radius and Sphericity Calibration Services |
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Interferometry XIV: Techniques and Analysis - Optical... Interferometry XIV: Techniques and Analysis (Proceedings Volume) Coarse frequency comb interferometry Author(s): J. Schwider See International Society for Optical Engineering (The) Information |
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Interferometry XIV: Applications - Optical Engineering +... Interferometry XIV: Applications (Proceedings Volume) Twymann Green interferometry in study of AlN material as an actuation layer in MEMS See International Society for Optical Engineering (The) Information |
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Post Flight Analysis -- Final Report Preface & Executive... invention of new technologies and processes for polishing, measuring sphericity, and thin-film coating, the result was a homogenous 1.5-inch sphere See NASA Goddard Space Flight Center Information |
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Offline Data Processing Requirements |
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MPIfR Optical and Infrared Interferometry Group: Publications Publications of the MPIfR Optical & Infrared Interferometry Group |
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GP-B Launch Companion1 node Gyroscopes (4) Measurements Shape Spherical (Sphericity < 40 atomic layers Predicted Drift- 6,614.4 milliarcseconds or 6.6 arcseconds from |
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Calibration - Taylor Hobson - Calibration It's radius, roundness/sphericity and surface texture are each calibrated to provide a high precision multi-purpose standard. See Taylor Hobson Precision Information |
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Astron. Astrophys. 354, 315?320 (2000) ASTRONOMY AND... 354, 315?320 (2000) ASTRONOMY AND ASTROPHYSICS Speckle interferometry measurements of the asteroids 10?Hygiea and 15?Eunomia R. Ragazzoni1, A. |
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Astron. Astrophys. 340, L39?L42 (1998) ASTRONOMY AND... LETTER Letter to the Editor Diffraction-limited speckle-masking interferometry of the red supergiant VY CMa M. Wittkowski1, N. Langer2, and G. |