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Product Categories for atomic force microscope instrument structure
Microscopes, All Types -
(477 companies)
Microscopes are instruments that produce magnified images of small objects
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Wafer and Thin Film Instrumentation -
(261 companies)
Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
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Microscopy and Metallography Sample Preparation Equipment -
(67 companies)
Microscopy and metallography sample preparation equipment is used for the preparation of samples for metallographic or microscopic inspection and analysis.
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Styli and Probes -
(52 companies)
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners.
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Specialty Microscopes -
(152 companies)
Specialty microscopes are designed for specific applications such as metallurgy or gemology. They use specialized techniques or technologies such as acoustics to produce magnification
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Microscope Accessories and Supplies -
(164 companies)
Microscope accessories and supplies are used with many different types of microscopes, including dissection or stereoscopic, compound, and confocal devices
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Measuring Microscopes -
(64 companies)
Measuring microscopes are used by toolmakers for measuring the properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view
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Metallurgical Microscopes -
(60 companies)
Metallurgical microscopes are used for metallurgical inspection including metals, ceramics, and other materials
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Biological Microscopes -
(97 companies)
Biological microscopes are used to study organisms and their vital processes
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Electron Microscopes -
(38 companies)
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition
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Force and Load Sensors -
(365 companies)
Force and load sensors covers electrical sensing devices used to measure tension, compression, and shear forces
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Optical and Light Microscopes -
(165 companies)
Optical and light microscopes use the visible or near-visible portion of the electromagnetic spectrum to magnify images of objects
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Test Equipment and Instrument Repair Services -
(327 companies)
Test equipment and instrument repair services test and repair industrial equipment and instruments. They specialize in the test and repair of acoustic and vibration equipment, electrical and electronic test equipment, laboratory equipment and instruments, inspection instruments or non-destructive testing (NDT) equipment, or specialty testing equipment and instruments
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Six-axis Force and Torque Sensors -
(12 companies)
Six-axis force and torque sensors measure the full six components of force and torque: vertical, lateral, and longitudinal forces as well as camber, steer, and torque movements
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Digital and Video Microscopes -
(151 companies)
Digital and video microscopes are instruments that use digital technology to magnify images of objects. They include built-in cameras and a series of high-powered lenses that provide superior image quality and resolution
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Tools & Useful Links for atomic force microscope instrument structure
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Engineering Web: atomic force microscope instrument structure
1 - 10 of 1,234,261
Modularity redefines the atomic force microscope
... one instrument. Soon after its invention in 1986, the atomic force microscope (AFM) established itself as a groundbreaking laboratory instrument that offered intriguing insights into the structure of ...
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Atomic-force microscope makes silicon microlenses
Silicon substrates were cut from a silicon wafer covered by a thin native silicon dioxide (SiO2) layer. An atomic-force-microscope (AFM) gray-scale Âpatterning technique allows microlens arrays to be ...
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Abstracts of Papers of the Experimental Physics Group
An atomic force microscope (AFM) can image surfaces of conductors, insulators, and even organic materials. Images of highly oriented pyrolytic graphite show atomic structure with a corrugation height ...
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[No Title]
... for Scanning Electron Microscope Beam Size Characterization. E987 - Standard Test Methods for Deglazing Force of Fenestration Products. E988 - Standard Temperature-Electromotive Force (EMF) Tables for ...
See ASTM International Information
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Atomic-force microscopy guides industrial manufacturing and R&D
Three-dimensional atomic-force microscope (AFM) "height" images provide high-resolution topographic maps of the surface that help us understand the detailed structure of optical thin films and ...
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Atomic Physics
... an ultrahigh vacuum atomic force microscope and scanning tunneling microscope for in-situ studies of surfaces modified by collisions with highly charged ions. Applications that we hope to explore in ...
See NIST (National Institute of Standards & Technology) Information
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Biomedical imaging discovers new MOLECULAR PARAMETERS
They began their work testing biotin-(strept) avidin bonds that served as prototypes for early studies using atomic force microscopy. Those studies provided force values only on a single time scale of ...
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Surface and Microanalysis Science Division - Technical Activities
o Near-Field optical and microwave nanoscale probes o Atomic force and conductive scanned probe microscopies With the beginning of fiscal year 2003, the Division will transition to a structure built ...
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New Products
The system advances existing nanotechnology capabilities to "see," sense and manipulate at the atomic and molecular scales. As the next-generation scanning probe/atomic force microscope system, the ...
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World News
... s 1550-nm tunable device is a microelectromechanical structure in which the top curved mirror of the laser cavity is displaced by voltage-induced electrostatic force. The cavity is designed for ...
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