Protractors and angle gages measure the angle between two surfaces of a part or assembly

Squares are used to indicate, by visual comparison, whether two surfaces are perpendicular. Most products consist of a simple, fixed standard and a beam and blade with a mutual orientation of 90 degrees.

Rules are flat, graduated scales used for length measurement.  For OEM applications, digital or electronic linear scales are often used.

Surface finishing products and equipment are used to refine or roughen a surface to meet surface finish requirements, or to clean, strengthen or prepare the surface for additional processing.

Tool and die makers manufacture progressive tooling, stamping dies, jigs, fixtures, and other tooling

Mold making services design and build tooling and patterns for a variety of molding processes, including investment casting, permanent mold casting, sand casting, die casting, lost foam casting, powder metal, die forging, injection molding, blow molding, extrusion, thermoforming, compression molding, rotational molding and others

Gage blocks are manufactured to precise gagemaker tolerance grades for calibrating, checking, and setting fixed and comparative gages

Die cutting services use a variety of die cutting methods to fashion materials into predefined shapes or sizes

Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore

Form gages and form gaging systems are used to inspect parameters such as roundness, angularity, squareness, straightness, flatness, runout, taper and concentricity. 

Die cutters and die cutting machines convert web or sheet materials into shapes. They are used to process woven cloth, non-woven textiles, and rubber sheets

Thickness gages are used to make precise dimensional measurements on a wide variety of coatings and materials including steel, plastic, glass, rubber, ceramics, paint, electroplated layers, enamels, etc

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  

Thread gages are dimensional instruments for measuring and/or verifying thread size, pitch or other parameters

Masters and setting gages provide dimensional standards for calibrating other gages