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Products/Services for endpoint
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
Semiconductor equipment repair services repair, rebuild and refurbish equipment related to the manufacture and processing of semiconductors. Learn More about Semiconductor Equipment Repair Services
Machine vision systems are used for automated inspection and measurement in production environments. Search by Specification | Learn More about Machine Vision Systems
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
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Wafer Inspection Systems Olympus America Inc.
Wafer Measurement System from MTI Instruments MTI Instruments Inc.
Wafer Measurement System MTI Instruments Inc.
Thin Film Measurement System StellarNet, Inc.
CC-10 Wide Range Vacuum Gauge Televac
New Digital AVC Vacuum Gage Teledyne Instruments
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Product News for endpoint
SevenEasy pH and Cond. Meters
Two easy-to-use instruments, one for pH and one for conductivity measurement. Instruments that meet all your requirements, offering more than just electrochemistry measurement - without overstretching your budget. (read more)
Coulometric Karl Fischer Titrator Denver
Denver Instrument Model 260/275 Karl Fischer titrator provides easy, fast, accurate and affordable H2O moisture determination in ethanol, corn oil, soybean oil, bio-diesel, vegetable oils, petroleum products, pesticides, detergents, foods, pharmaceuticals, chemicals, & solvents. Analysis time is 1 to 2 minutes (read more)
Simriz® 499 for the Semiconductor Industry
Formulated with proprietary technology, Simriz 499 offers excellent resistance to solvents and acids
Simrit is expanding its Simriz® brand of perfluoroelastomer compounds with the introduction of the newly formulated Simriz 499 material. The latest in the Simriz line of proprietary materials, Simriz 499 was specifically developed to combine plasma resistance, broad chemical resist...
(read more)
Simriz® 508 for Semiconductor Applications
Simriz 508 is designed for demanding high temperature static or dynamic sealing applications in many dry chemical environments. Simriz 508 is suited for many oxidizing plasma chemistries. Simriz 508 also exhibits outstanding chemical resistance. (read more)
Parts by Number for endpoint
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 1011AM | PLC Radwell | XINIX | Not Provided | ENDPOINT CONTROLLER |
Conduct Research
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Endpoint Detection / Plasma Diagnostics
Endpoint detection of plasma etching, CMP, or other processes usually occurs through spectral analysis of the plasma, precursor gases, or thin film layers. In plasma etching, endpoint detection is...(read more)
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USB Mass Storage Device Using a PIC® MCU
In recent years, there has been immense growth in Universal Serial Bus (USB) based applications, primarily due to the Plug and Play nature of USB. This application note describes the design and...(read more)
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Demonstrating the Set_Report Request With a PS/2® to USB Keyboard Translator Example
The Set_Report request is a HID specific command. It was the only provision in Version 1.0 of the USB specification that could send data from the host to a peripheral. This later changed with Version...(read more)
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On the Fly Trajectory Modification
Many applications require an axis to precisely follow a randomly generated position target. Some examples of applications that may use this mode are satellite tracking, missile tracking, random...(read more)
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USB HID Class on an Embedded Device
AN1163 USB HID Class on an Embedded Device FEATURES Author: Sean Justice Microchip Technology Inc. This application note provides key components of a HID device class driver. The Microchip HID device...(read more)
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USB HID Class on an Embedded Device
AN1163 USB HID Class on an Embedded Device FEATURES Author: Sean Justice Microchip Technology Inc. This application note provides key components of a HID device class driver. The Microchip HID device...(read more)
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In-Line Monitoring of Cu Dual-Damascene Etch Processes
Dual-damascene methodology has dramatically reduced complexity and shortened real process times over traditional metal etch and fill methods. However, the improved technique introduces new issues in...(read more)
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Recent Advances in the Development of Ceria-Based Slurries for Inner Layer Dielectric CMP (.pdf)
Standard Inner Layer Dielectric (ILD) polishing utilizes an endpoint detection or a fixed time process to determine when to stop polishing. This can create non-uniformities across the oxide surface...(read more)
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How to Calculate Battery Run Time
This article explains how to calculate the battery run time you should expect for a specific brand and model of UPS Battery. For the purpose of this exercise there are some items that we need to...(read more)
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Xilinx XAPP1002 Using ChipScope Pro to Debug Endpoint Block... This application note also discusses two methods of inserting the ChipScope Pro ICON and ILA cores into Endpoint for PCIe cores. See Xilinx, Inc. Information |
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Endpoint Block Plus Wrapper for PCI Express Endpoint Block Plus Wrapper for PCI Express See Xilinx, Inc. Information |
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Java USB: Class Endpoint usb.core Class Endpoint java.lang.Object | +--usb.core.Descriptor | +--usb.core.Endpoint All Implemented Interfaces: |
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Demystifying WebSphere Business Services Fabric policy... Demystifying WebSphere Business Services Fabric policy evaluation and dynamic endpoint selection See International Business Machines Corp. Information |
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Create a WSDM endpoint using Build to Manage tooling from the... Create a WSDM endpoint using Build to Manage tooling from the Eclipse TPTP project Generating code and building the endpoint implementation See International Business Machines Corp. Information |
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psn-tunnel-endpoint - JUNOS 9.1 VPNs Configuration Guide [ Contents [ Prev [ Next [ Index [ Report an Error psn-tunnel-endpoint Syntax psn-tunnel-endpoint address; Hierarchy Level See Juniper Networks Inc. Information |
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Project: Endpoint - oss.oracle.com Endpoint Firewire FSCat GDB pstack hangcheck-timer Project: Endpoint [ Project Home | News |
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MATLAB Central - File detail - VRECKON: Find the endpoint of a... VRECKON: Find the endpoint of a geodesic on the ellipsoidal earth See MathWorks, Inc. (The) Information |
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Endpoint Security - Enforced Protection - SonicWALL, Inc. Endpoint Security Enforced Protection Site Map » ? Endpoint Security ? SSL VPN Secure Remote Access See SonicWALL, Inc. Profile & Catalog |
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Cypress Forums Forums - How can I change the endpoint address... See Cypress Semiconductor Corp. Information |
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