Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  

Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.

Linear velocity sensors measure the linear velocity of an object using either contact or non-contact techniques.

NDT supplies and accessories are components, ancillary equipment, standards, and consumable materials used in non-destructive testing (NDT).

Thickness gages are used to make precise dimensional measurements on a wide variety of coatings and materials including steel, plastic, glass, rubber, ceramics, paint, electroplated layers, enamels, etc

Humidity measurement instruments test for absolute humidity, relative humidity, or dew point in air

Web sensing and scanning systems employ a variety of sensors that scan across a moving web to detect defects and measure parameters such as product basis weight, thickness and moisture

Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore

Non-destructive testing (NDT) conductivity meters and resistivity meters are devices for measuring electrical conductivity and/or resistivity of solid media to determine the characteristics of its constituent materials.

Material testing services test, analyze, and certify a wide range of materials for purity, chemical compatibility, and environmental impact.

Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.

Laser micrometers measure extremely small distances using laser technology.

Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry

Measurement microphones are most commonly condenser microphones, which convert sound pressure to an output that is then converted into a reading such as sound pressure level (SPL