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Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Products/Services for Langmuir probe
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More about CMM Probes
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More about Electrical Test Probes
Temperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes. Search by Specification | Learn More about Temperature Probes
Thermistor temperature probes sense temperature by using thermistors, devices made of semiconductor materials which exhibit a large change in resistance for a small change in temperature. Search by Specification | Learn More about Thermistor Temperature Probes
Thermocouple temperature probes are bimetallic probes that are used in various temperature-sensing applications. They consist of two wires, each of which is made of a different metallic element or alloy. Search by Specification | Learn More about Thermocouple Temperature Probes
Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products. Search by Specification | Learn More about Position Probes
IC pin probes are used to test integrated circuits (ICs). Search by Specification | Learn More about IC Pin Probes
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn More about Styli and Probes
RTD temperature probes convert the RTD resistance measurement to a current signal, eliminating the problems inherent in RTD signal transmission via lead resistance. Search by Specification | Learn More about RTD Temperature Probes
Nondestructive testing (NDT) probes and sensors include eddy current, ultrasonic, induction, hall effect and EMAT and other specialized transducers. Search by Specification | Learn More about Nondestructive Testing (NDT) Probes
Eddy current probes induce detectable eddy currents in ferrous and nonferrous material for flaw detection, weld inspection, and other nondestructive test applications. Search by Specification | Learn More about Eddy Current Probes
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More about Fiber Optic Probes
Corrosion probes, corrosion coupons and corrosion coupon holders are corrosion-sensing devices that interface to instruments or monitors. Learn More about Corrosion Probes, Coupons and Holders
Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters Search by Specification | Learn More about Temperature Instruments
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Wafer Measurement System MTI Instruments Inc.
Thin Film Measurement System StellarNet, Inc.
Wafer Measurement System from MTI Instruments MTI Instruments Inc.
Wafer Inspection Systems Olympus America Inc.
CC-10 Wide Range Vacuum Gauge Televac
New Digital AVC Vacuum Gage Teledyne Instruments
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Product News for Langmuir probe
Do you have data acquisition challenges?
Is this what your problem looks like? Need diagnostics, simultaneous channels, imaging and control inputs? Using intelligent simultaneous digitizers can solve your demanding data acquisition problems and D-tAcq offers 96 analog inputs in one slot. (read more)
Workpiece Touch Probes Increase Productivity
The use of touch probes reduces setup times, helps to increase machine usage time, and improves the dimensional accuracy of the finished workpieces. Their setup, measuring and monitoring functions can be performed manually or automatically. Touch probes are used primarily on milling machines and machining centers, and ... -HEIDENHAIN Corporation (read more)
RMP600 machine probe out-of-sight in 3D precision
Bringing "out of sight" precision to complex 3D part measurement on machine tools, the new RMP600 touch probe combines two exclusive Renishaw technologies — highest accuracy strain-gage sensing and frequency-hopping spread-spectrum (FHSS) radio transmission. The design allows unmatched precision where obstacles or part features block transmission by optical line-of-sight probes. (read more)
RMP60 Frequency-Hopping Wireless Inspection Probe
The RMP60 inspection probe is the industry's first to use frequency hopping spread spectrum (FHSS) transmission to avoid plant floor interferences, enabling reliable, high-accuracy, fast-throughput part verification on machining centers of all sizes. (read more)
2-in-1 versatility - Scanning probes for your CMMs
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability (read more)
HEIDENHAIN's Highly Accurate 3D Tool Touch Probe
With the introduction of the TS 740 infrared touch probe, HEIDENHAIN offers machine tool users the opportunity to perform measuring tasks that require an especially high probing accuracy and repeatability. Providing both of these things, the TS 740 workpiece touch probe has become one of the most accurate 3D touch probes for machine tools in the market today. (read more)
Cable-free twin probe system for machine tools
Cable-free OTS Twin-Probe System from Renishaw performs automated part set-up, measurement, tool setting and broken tool detection. The machine tool system combines a spindle-mounted OMP40-2 inspection probe and OTS tool-setting probe with an optical receiver, enabling fast system integration and cable-free installation on machining centers, especially with twin pallets and rotary tables. (read more)
Heidenhain 3-D Touch Probes for 3rd Party Controls
Heidenhain has developed a new interface for its 3-D touch trigger probes (read more)
New Tool Setting Probe – OTS Tool Setting Probe
For broken tool detection and rapid tool length/diameter measurement use the new OTS, Renishaw's first tool setting probe with optical transmission. The robust, compact and cable-free design allows freedom of table movement, ideal for twin pallet or rotary table machines. (read more)
X Probe Socketless Series
The X Probe Socketless Series allows a more robust probe to be mounted on closer centers while maintaining a reliable electrical contact from the probe tip to the termination. The conventional method utilizes a probe and socket system. (read more)
Conduct Research
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Endpoint Detection / Plasma Diagnostics
Endpoint detection of plasma etching, CMP, or other processes usually occurs through spectral analysis of the plasma, precursor gases, or thin film layers. In plasma etching, endpoint detection is...(read more)
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MATLAB Central - File detail - Langmuir probe data analysis... Langmuir probe data analysis code by aasim Azooz four parameters fitting of Langmuir I-V probe data See MathWorks, Inc. (The) Information |
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MATLAB Central - Files chemistry eedf langmuir probe physics plasma plasma potential plasma temperature See MathWorks, Inc. (The) Information |
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Langmuir probe - Wikipedia, the free encyclopedia A Langmuir probe is a device named after Nobel Prize winning physicist Irving Langmuir, used to determine the electron temperature, electron density, |
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An Improved Langmuir Probe Formula for Modeling Satellite... An Improved Langmuir Probe Formula for Modeling Satellite Interactions With Near-Geostationary Environment See Storming Media LLC Information |
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Investigation of Radio Frequency Discharges and Langmuir Probe... Investigation of Radio Frequency Discharges and Langmuir Probe Diagnostic Methods in a Fast Flowing Electronegative Background Gas See Storming Media LLC Information |
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NASA - NSSDC - Experiment - Details Langmuir Probe (LAP) NSSDC ID: 2004-006A-12 Mission Name: Rosetta Principal Investigator: Prof. Rolf Bostrom |
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NASA's Explorer Missions |
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Two dimensional PIC simulation of a Langmuir probe in a plasma... Two dimensional PIC simulation of a Langmuir probe in a plasma beam |
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Improved Langmuir Probe Array for DIII-D Title: Improved Langmuir Probe Array for DIII-D Publisher Name: IEEE Meeting Location: Albuquerque, NM, USA Item Abstract: Langmuir probes are |
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Physical Review Special Topics - Accelerators and Beams |
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