Product Categories for measurement thickness wafer
Thickness Gages -
(243 companies)
Thickness gages are used to make precise dimensional measurements on a wide variety of coatings and materials including steel, plastic, glass, rubber, ceramics, paint, electroplated layers, enamels, etc
Thickness Resolution:
|
|
|
Search by Specification |
Learn more about Thickness Gages
|
Semiconductor Metrology Instruments -
(114 companies)
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.
Search by Specification |
Learn more about Semiconductor Metrology Instruments
|
Wafer and Thin Film Instrumentation -
(262 companies)
Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing
Search by Specification |
Learn more about Wafer and Thin Film Instrumentation
|
Surface Profilometers -
(131 companies)
Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
Search by Specification |
Learn more about Surface Profilometers
|
Corrosion and Electrochemical Instruments -
(76 companies)
Corrosion and electrochemical instruments use a variety of methods to detect and measure corrosion and electrochemical conditions in plant machinery, field equipment, batteries, fuel cells, colloids, and other solutions or systems.
Search by Specification |
Learn more about Corrosion and Electrochemical Instruments
|
Superabrasives and Diamond Wheels -
(274 companies)
Superabrasives and diamond wheels consist of grinding wheels, abrasive saw blades, wheel dressers, single point tools and other products utilizing diamond or cubic boron nitride (CBN) abrasive grain.
Search by Specification |
Learn more about Superabrasives and Diamond Wheels
|
Optical and Light Microscopes -
(174 companies)
Optical and light microscopes use the visible or near-visible portion of the electromagnetic spectrum to magnify images of objects.
Search by Specification |
Learn more about Optical and Light Microscopes
|
Thin Film Process Monitors -
(33 companies)
Thin film process monitors are used to control thin film deposition rate or composition during processing.
Learn more about Thin Film Process Monitors
|
X-ray Fluorescence Spectrometers -
(51 companies)
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays.
Search by Specification |
Learn more about X-ray Fluorescence Spectrometers
|
Thin Film Materials -
(133 companies)
Thin film materials are high purity materials and chemicals such as precursor gases, sputtering targets or evaporation filaments used to form or modify thin film deposits and substrates.
Learn more about Thin Film Materials
|
Optical Lenses -
(333 companies)
Optical lenses are transparent components made from optical-quality materials and curved to converge or diverge transmitted rays from an object. These rays then form a real or virtual image of the object. This area includes micro lenses.
Search by Specification |
Learn more about Optical Lenses
|
Industrial Coatings -
(1536 companies)
Industrial coatings are thin films deposited upon materials to add or enhance desired properties, such as color, conductivity, corrosion resistance, etc.
Search by Specification |
Learn more about Industrial Coatings
|
Material Testing Services -
(846 companies)
Material testing services test, analyze, and certify a wide range of materials for purity, chemical compatibility, and environmental impact.
Search by Specification |
Learn more about Material Testing Services
|
Humidity Measurement Instruments -
(411 companies)
Humidity measurement instruments test for absolute humidity, relative humidity, or dew point in air
Search by Specification |
Learn more about Humidity Measurement Instruments
|
Dimensional Measurement and Metrology Services -
(129 companies)
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry
Learn more about Dimensional Measurement and Metrology Services
|
More >>
|
|
Product Announcements for measurement thickness wafer
Product Announcements: 1 - 10 of 5239
|
|
Fischer Technology, Inc. / Coating Thickness Gages
MP30 ISOSCOPE Coating Thickness Measurement
The ISOSCOPE® MP30E-S Coating Thickness Gauge measures coatings over non-ferrous substrates such as aluminum, stainless steel or zinc using the eddy current method. Any assortment of coating thicknesses can be measured with the ISOSCOPE® MP30 Coating Thickness Gauge due to the wide range of smart probes available with this instrument.
(read more)
More product announcements from Fischer Technology, Inc. / Coating Thickness Gages
Browse Fischer Technology, Inc. / Coating Thickness Gages Catalog
Browse Thickness Gages Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
|
|
|
MTI Instruments Inc.
Non-Contact Wafer Thickness Gage
The Proforma 300 TM wafer thickness gage can be used to measure thickness, bow and TTV on all wafer materials including: silicon,gallium-arsenide,indium phosphide and germanium without recalibrating or electrically grounding the wafer.
(read more)
More product announcements from MTI Instruments Inc.
Browse MTI Instruments Inc. Catalog
Browse Thickness Gages Datasheets for MTI Instruments Inc.
|
|
|
MTI Instruments Inc.
Wafer Measurement System from MTI Instruments
Proforma 200SA - Semi-automated, full wafer surface scanning for thickness, TTV, bow, warp, site and global flatness. The Proforma 200SA can be used for all wafer materials and accommodates diameters 75 - 300 mm.
(read more)
More product announcements from MTI Instruments Inc.
Browse MTI Instruments Inc. Catalog
Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
|
|
|
MTI Instruments Inc.
Semiconductor Wafer Thickness Gage
Proforma 300/G - Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
(read more)
More product announcements from MTI Instruments Inc.
Browse MTI Instruments Inc. Catalog
Browse Thickness Gages Datasheets for MTI Instruments Inc.
|
|
|
MTI Instruments Inc.
Wafer Measurement System
ProformaTM AutoScan 200 - Fully automated wafer characterization system for measuring thickness, TTV, bow, warp, bulk resistivity, site and global flatness. The Proforma AutoScan 200 features pick and place robotics, laser cassette scanning, auto-sensing cassette stands for wafers 75 - 200 mm diameter, and a modular design for easy upgrades.
(read more)
More product announcements from MTI Instruments Inc.
Browse MTI Instruments Inc. Catalog
Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
|
|
|
Fischer Technology, Inc. / Coating Thickness Gages
Coating Thickness Measurement - PHASCOPE® PMP10:
PHASCOPE® PMP10: Measure Copper Coating Thickness better with Eddy Current User-friendly, reproducible, accurate measurement of copper thicknesses using the phase-sensitive eddy-current method.
(read more)
More product announcements from Fischer Technology, Inc. / Coating Thickness Gages
Browse Fischer Technology, Inc. / Coating Thickness Gages Catalog
Browse Eddy Current Instruments Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
|
|
|
Fischer Technology, Inc. / Coating Thickness Gages
Coating Thickness Measurement Bench Top Units
FISCHERSCOPE® MMS® PCB: Three in one instrument A universal measurement system for pc-boards measures the thicknesses of solder resist coatings as well as copper on surface areas and in boreholes.
(read more)
More product announcements from Fischer Technology, Inc. / Coating Thickness Gages
Browse Fischer Technology, Inc. / Coating Thickness Gages Catalog
Browse Thickness Gages Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
|
|
|
MTI Instruments Inc.
Wafer Metrology Measurement Tool
The Proforma 300SA is a semi-automated tool for measuring wafer bow, warp, flatness and stress.
(read more)
More product announcements from MTI Instruments Inc.
Browse MTI Instruments Inc. Catalog
|
|
|
Precitec, Inc.
Distance and Thickness CHRomatic Sensor--CHR 150 E
With thickness and topographical measurement speeds up to 1000 measurements per second, CHR 150 E is the low cost, high performance solution to non-contact inspection problems.
(read more)
More product announcements from Precitec, Inc.
Browse Precitec, Inc. Catalog
|
|
|
Fischer Technology, Inc. / Coating Thickness Gages
DUALSCOPE® MP0R USB Coating Thickness Gauge
DUALSCOPE® MP0R USB Coating Thickness Gauge: Precise measurement - displayed twice! When measuring coating thicknesses, obtain measurement data with confidence through two displays on the portable instrument.
(read more)
More product announcements from Fischer Technology, Inc. / Coating Thickness Gages
Browse Fischer Technology, Inc. / Coating Thickness Gages Catalog
Browse Thickness Gages Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
|
More >>
Other Topics You Might Be Interested In
Interferometric microscopes use the interference patterns of light waves for precise determinations of distance, thickness, surface or step heights, wavelength, roughness and non-contact 3D surface...
( Read More)
Vision systems for wafer and thin-film instrumentation include specialized optical instruments such as microscopes or imaging, CD resolution, defect detection and classification, surface roughness,...
( Read More)
Atomic force microscopy (AFM) is being used in a great variety of force measurement applications, including investigating the unfolding pathways of native membrane proteins2, probing the structure of...
( Read More)
Tools & Useful Links for measurement thickness wafer
Tools & Useful Links: 1 - 6 of 6
Engineering Web: measurement thickness wafer
1 - 10 of 614
|
|
Find Companies By Name
View GlobalSpec Directory
Find Engineering Standards for measurement thickness wafer
Find Patents for measurement thickness wafer
|
