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Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry
Learn MoreSemiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
Search by Specification | Learn MoreSurface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects
Search by Specification | Learn MoreMaterial testing services test, analyze, and certify a wide range of materials for purity, chemical compatibility, and environmental impact.
Search by Specification | Learn MoreWafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing
Search by Specification | Learn MoreInterferometers measure distance in terms of wavelength and determine the wavelengths of light sources.
Search by Specification | Learn MoreDimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore.
Search by Specification | Learn MoreImaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings
Search by Specification | Learn MoreAir gages use pneumatic pressure and flow to measure or sort dimensional attributes.
Search by Specification | Learn MoreMicrometers are instruments for precision dimensional gaging consisting of a ground spindle and anvil mounted in a C-shaped steel frame. Noncontact laser micrometers are also available.
Search by Specification | Learn MoreCalibration standards and reference sources include any source that can provide a reference for the calibration of an instrument or comparison of a material or component.
Search by Specification | Learn MoreFurniture consists of seating, benches, tables, cabinets and chairs for indoor or outdoor applications.
Learn MoreSurface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
Search by Specification | Learn MoreProduct and component testing services is the evaluation of a finished product or component through performance in electrical, life, environmental exposure, dynamic, ergonomic or other specialized tests. Also testing to standards such as UL 489, CE or MIL-STD 810.
Search by Specification | Learn MoreBore and ID gages are designed for internal diameter dimensional measurement or assessment.
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Field Evaluations Underwriters Laboratories
Electrical Testing Underwriters Laboratories
Environmental Exposure Testing E-Labs, Inc.
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Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. (read more)
Achieve 0.1 micron resolution, 3 Dimensional (3-D) metrology, and inspect both sides of the wafer simultaneously in a system that is SECS/GEM compliant and is compatible with Class 10 or above Clean Room Applications. (read more)
Stork Materials Technology operates laboratories in Belgium and the Netherlands that specialize in Calibration and Geometric Measurement. With advanced technology and instrumentation, we verify the accuracy of your pressure, temperature, relative humidity, electrical, chemical, geometrical and other instruments. We offer onsite calibration services as well as repair and transport services. (read more)
Raloid Tool Company, Inc. manufactures custom surface metrology equipment to match your specifications. (read more)
Get the latest metrology information delivered to you on a regular basis. (read more)
Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. (read more)
The Proforma 300SA is a semi-automated tool for measuring wafer bow, warp, flatness and stress. (read more)
VISIONx Inc. manufactures custom Semiconductor Metrology Instruments to solve a wide range of unique, one-of-a-kind custom visual inspection and machine vision applications. (read more)
Quadra-Chek 300 Series Geometric Readouts
The QC-300 is an advanced digital readout with an enhanced, color touch-screen interface. It includes patented Measure Magic technology and is ideal for the measurement of 2-D and 3-D features. Crosshair, optical edge detection and video edge detection systems for 2-D measurements can be automated with CNC motion control options. The QC-300...
(read more)
SMA uses state of the art inspection equipment to measure those microns that can't be seen . (read more)
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modus_e Coordinate Metrology - Staff - Research Modular Multisensor system for 3D Measurement of Microparts (MODUS) |
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PTB, 5.3, Personal Coordinate Metrology - Research - Publications Head of Working Group Multisensor Metrology AG 5.34 |
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Industry News: Modus Metrology Offers New Services - News -... Industry News: Modus Metrology Offers New Services November 21, 2007 |
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News - Quality |
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Übersichtskamera - Leica Geosystems - Metrology Metrology Produkte Metrology Produkte Zubehör Zubehör für Laser Tracker Systeme Übersichtskamera |
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Archive 2004 - Leica Geosystems - Metrology Metrology Press Metrology Press Archive Archive 2004 Metrology Press Releases from 2004 Leica Geosystems stellt den LEICA SPRINTER |
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Nolatek - Electronic Solutions See Nolatek Information |
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Itherm2002, The Eighth Intersociety Conference on Thermal and... Today's modus operandi, one of energy balance in computing units. |
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Business engineering company brings specialists in: News from... in the setting-up of the Modus project, which culminated in the launch, at the Madrid trade fair in May 2004, of Modus, the mini-people carrier |
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NCSLI Calendar of Events Search Results Ed Pritchard Phone: 866-788-9555 Email: epritchard@modusmet.com Modus Metrology will host a Tennessee Section meeting in Knoxville on October 23rd at |