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Product Categories for modus metrology

Dimensional Measurement and Metrology Services - (129 companies)

Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry

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Semiconductor Metrology Instruments - (114 companies)

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  

Form Factor: Monitor / Instrument | Wafer Probing System | Sensor / Sensing Element | Other
Mounting / Loading: Autoloading / In-line | Manual Loading | Floor Mounted / Stand-alone
Applications: Semiconductor Wafers | CVD / PVD Films | Electroplated Films | Etching - Plasma / Wet
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Surface Metrology Equipment - (180 companies)

Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects

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Material Testing Services - (849 companies)

Material testing services test, analyze, and certify a wide range of materials for purity, chemical compatibility, and environmental impact.

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Wafer and Thin Film Instrumentation - (261 companies)

Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing

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Interferometers - (90 companies)

Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources.

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Dimensional Gages and Instruments - (865 companies)

Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore.

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Imaging Workstations - (264 companies)

Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings

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Air Gages - (87 companies)

Air gages use pneumatic pressure and flow to measure or sort dimensional attributes.

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Micrometers - (177 companies)

Micrometers are instruments for precision dimensional gaging consisting of a ground spindle and anvil mounted in a C-shaped steel frame.  Noncontact laser micrometers are also available.

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Calibration Standards and Reference Sources - (354 companies)

Calibration standards and reference sources include any source that can provide a reference for the calibration of an instrument or comparison of a material or component.

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Furniture - (163 companies)

Furniture consists of seating, benches, tables, cabinets and chairs for indoor or outdoor applications.

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Surface Profilometers - (132 companies)

Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.

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Product and Component Testing Services - (1397 companies)

Product and component testing services is the evaluation of a finished product or component through performance in electrical, life, environmental exposure, dynamic, ergonomic or other specialized tests.  Also testing to standards such as UL 489, CE or MIL-STD 810.

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Bore and ID Gages - (136 companies)

Bore and ID gages are designed for internal diameter dimensional measurement or assessment.

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See more product announcements for Dimensional Measurement and Metrology Services
Field Evaluations

Field Evaluations
Underwriters Laboratories


Electrical Testing

Electrical Testing
Underwriters Laboratories


Environmental Exposure Testing

Environmental Exposure Testing
E-Labs, Inc.


11 See more product announcements for Dimensional Measurement and Metrology Services

Product Announcements for modus metrology
Mahr Federal Inc.
MarSurf™ WS 1 Optical Surface Metrology System

Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. (read more)

More product announcements from Mahr Federal Inc.
Browse Mahr Federal Inc. Catalog
Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc.
DWFritz Automation, Inc.
Automated 3D Wafer Metrology Tool

Achieve 0.1 micron resolution, 3 Dimensional (3-D) metrology, and inspect both sides of the wafer simultaneously in a system that is SECS/GEM compliant and is compatible with Class 10 or above Clean Room Applications. (read more)

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Browse DWFritz Automation, Inc. Catalog
Stork Materials Technology
Calibration and Metrology

Stork Materials Technology operates laboratories in Belgium and the Netherlands that specialize in Calibration and Geometric Measurement. With advanced technology and instrumentation, we verify the accuracy of your pressure, temperature, relative humidity, electrical, chemical, geometrical and other instruments. We offer onsite calibration services as well as repair and transport services. (read more)

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Browse Stork Materials Technology Catalog
Raloid Tool Company, Inc.
Custom Surface Metrology Equipment

Raloid Tool Company, Inc. manufactures custom surface metrology equipment to match your specifications. (read more)

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Carl Zeiss IMT Corporation
Metrology E-Newsletter

Get the latest metrology information delivered to you on a regular basis. (read more)

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Browse Carl Zeiss IMT Corporation Catalog
Browse Dimensional and Profile Scanners Datasheets for Carl Zeiss IMT Corporation
Metal Cutting Corporation
Cleanroom Metrology

Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. (read more)

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MTI Instruments Inc.
Wafer Metrology Measurement Tool

The Proforma 300SA is a semi-automated tool for measuring wafer bow, warp, flatness and stress. (read more)

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Browse MTI Instruments Inc. Catalog
Visionx Inc.
Custom Semiconductor Metrology Instruments

VISIONx Inc. manufactures custom Semiconductor Metrology Instruments to solve a wide range of unique, one-of-a-kind custom visual inspection and machine vision applications. (read more)

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Metronics Incorporated
Metrology System, color touch-screen interface

Quadra-Chek 300 Series Geometric Readouts
The QC-300 is an advanced digital readout with an enhanced, color touch-screen interface. It includes patented Measure Magic technology and is ideal for the measurement of 2-D and 3-D features. Crosshair, optical edge detection and video edge detection systems for 2-D measurements can be automated with CNC motion control options. The QC-300... (read more)

More product announcements from Metronics Incorporated
Browse Metronics Incorporated Catalog
Browse Digital Readouts Datasheets for Metronics Incorporated
SMA Technologies, Inc.
Metrology...

SMA uses state of the art inspection equipment to measure those microns that can't be seen . (read more)

More product announcements from SMA Technologies, Inc.
Browse SMA Technologies, Inc. Catalog
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Engineering Web: modus metrology
modus_e
Coordinate Metrology - Staff - Research Modular Multisensor system for 3D Measurement of Microparts (MODUS)
PTB, 5.3, Personal
Coordinate Metrology - Research - Publications Head of Working Group Multisensor Metrology AG 5.34
Industry News: Modus Metrology Offers New Services - News -...
Industry News: Modus Metrology Offers New Services November 21, 2007
News - Quality

Übersichtskamera - Leica Geosystems - Metrology
Metrology Produkte Metrology Produkte Zubehör Zubehör für Laser Tracker Systeme Übersichtskamera
Archive 2004 - Leica Geosystems - Metrology
Metrology Press Metrology Press Archive Archive 2004 Metrology Press Releases from 2004 Leica Geosystems stellt den LEICA SPRINTER
Nolatek - Electronic Solutions

See Nolatek Information
Itherm2002, The Eighth Intersociety Conference on Thermal and...
Today's modus operandi, one of energy balance in computing units.
Business engineering company brings specialists in: News from...
in the setting-up of the Modus project, which culminated in the launch, at the Madrid trade fair in May 2004, of Modus, the mini-people carrier
NCSLI Calendar of Events Search Results
Ed Pritchard Phone: 866-788-9555 Email: epritchard@modusmet.com Modus Metrology will host a Tennessee Section meeting in Knoxville on October 23rd at

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Related Keywords
monument design system, nanometer resolution machine, nanometer resolution measuring equipment, nanometer resolution measuring machine, nanometer resolution metrology equipment




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