Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.

Web application software is used in the design, implementation, optimization and maintenance of web sites and web clients. These tools include web browsers, plug-ins, scripting languages, and other similar applications

Process reactors are containers that are used to contain reactions.

Pipe fittings include many components that connect pipe ends for in-line, offset, multi-port, and mounting configurations.

Helical gears transmit power and motion between parallel axes (opposite hand) or right-angle axes (same-hand).

Worm gears are cylindrical gears with a spiral thread that drive mating worm wheels in high-reduction gearset applications. They operate on non-intersecting perpendicular axes.

Enterprise manufacturing intelligence (EMI) software provides real-time information about manufacturing processes. EMI software helps businesses optimize the performance of these processes and maximize yields.

Roller chains are used in many power transmission designs. They are characterized by ANSI and BS/DIN standard sizes.

Website development and optimization services providers design, publish, market and/or perform SEO operations for websites

Power quality analyzers measure and monitor electrical power parameters to avoid disturbances, track steady-state variations, and ensure the reliability of power distribution systems

Process development services can develop new processes, run process research and development (R&D) programs, perform optimization studies, improve current processing methods and provide other assistance in process development activities

Thin film process monitors are used to control thin film deposition rate or composition during processing.

Scalar network analyzers measure the amplitude portion of scattering or S-parameters, reflection and transmission coefficients between the incident and reflection waves that describe a device’s behavior under linear conditions at the microwave frequency range

Transformer Test Equipment consists of specialized test modules or systems used to test and/or monitor electrical and mechanical parameters of transformers and other related devices

Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters