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Product Categories for particle beam
Particle Size Analyzers and Particle Count Analyzers - (142 companies)
Particle size analyzers and particle count analyzers are used to determine the physical makeup of samples
Measurement Type: Size | Count
Count Operating Principle: Light Blockage | Filter Blockage | Other
Search by Specification | Learn more about Particle Size Analyzers and Particle Count Analyzers

Ion and Electron Beam Guns and Accessories - (50 companies)
Ion and electron beam guns and accessories produce beams of electrons, ions or other particles for use in chemical and surface analysis, particle physics, resin curing or semiconductor manufacturing Learn more about Ion and Electron Beam Guns and Accessories

Nondestructive Testing (NDT) Services - (462 companies)
Non-destructive testing (NDT) services use test methods to examine an object, material or system without impairing its future usefulness. Search by Specification | Learn more about Nondestructive Testing (NDT) Services

Thin Film Sources - (66 companies)
Thin film sources consist of magnetrons, evaporation thermal units, ion beams and other sources that produce deposition materials (vapors or ions) in a thin film system Learn more about Thin Film Sources

Coating Equipment, All Types - (1043 companies)
Coating equipment is used to apply organic, inorganic or metal coatings onto part surfaces for industrial applications. Search by Specification | Learn more about Coating Equipment, All Types

Semiconductor Metrology Instruments - (113 companies)
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   Search by Specification | Learn more about Semiconductor Metrology Instruments

Wafer and Thin Film Instrumentation - (261 companies)
Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn more about Wafer and Thin Film Instrumentation

Flow Cytometers - (15 companies)
Flow cytometers use laser beams to characterize single cells as they pass by at high speed Learn more about Flow Cytometers

Dimensional Measurement and Metrology Services - (126 companies)
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Learn more about Dimensional Measurement and Metrology Services

Thickness Gages - (235 companies)
Thickness gages are used to make precise dimensional measurements on a wide variety of coatings and materials including steel, plastic, glass, rubber, ceramics, paint, electroplated layers, enamels, etc Search by Specification | Learn more about Thickness Gages

HPLC Detectors - (52 companies)
High performance liquid chromatograph (HPLC) detectors pass a beam of light through a column effluent as the fluid passes through a low-volume flow cell. Variations in light intensity are recorded and a chromatograph is generated Search by Specification | Learn more about HPLC Detectors

Cleaning Agents and Surface Treatments - (1390 companies)
Cleaning agents and surface treatments includes liquid cleaners, degreasers, strippers, passivators, etchants, solutions and additives for cleaning and surface preparation. Search by Specification | Learn more about Cleaning Agents and Surface Treatments

Mass Spectrometers - (85 companies)
Mass spectrometers separate ions by their mass-to-charge (m/z) ratios. They are used to identify compounds by the mass of one or more elements in the compound. They are also used to determine the isotopic composition of one or more elements in a compound. Search by Specification | Learn more about Mass Spectrometers

Residual Gas Analyzers - (50 companies)
Residual gas analyzers (Rags) identify the gases present in vacuum environments. Search by Specification | Learn more about Residual Gas Analyzers

Visibility Sensors, Dust Sensors and Opacity Sensors - (59 companies)
Opacity sensors, dust sensors and visibility sensors measure the amount of light transmitted through a sample. Search by Specification | Learn more about Visibility Sensors, Dust Sensors and Opacity Sensors


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See more product announcements for Particle Size Analyzers and Particle Count Analyzers
VisionGauge® OnLine Machine Vision Software

VisionGauge® OnLine Machine Vision Software
Visionx Inc.


MET ONE 4500 Series

MET ONE 4500 Series
Hach Ultra


EnviroCam for Use in PAT

EnviroCam for Use in PAT
EnvirOptics


11 See more product announcements for Particle Size Analyzers and Particle Count Analyzers

Product Announcements for particle beam

Product Announcements: 1 - 10 of 1530
Malvern Instruments, Inc. - Particle Size - Particle Measuring Dry Samples
Malvern Instruments, Inc.
Particle Size - Particle Measuring Dry Samples

Particle Measuring (Powders, Granules, etc.) from Malvern Instruments. Malvern has a wide range of systems for the characterizing the size of dry samples, powders or granules. Many materials across many branches of industry are produced as dry powders or granules. The stability, chemical reactivity, opacity, flowability and material strength of many materials are affected by... (read more)

More product announcements from Malvern Instruments, Inc.
Browse Malvern Instruments, Inc. Catalog
Browse Imaging Workstations Datasheets for Malvern Instruments, Inc.
Vindum Engineering, Inc. - PC-2200 Laser Particle Counter
Vindum Engineering, Inc.
PC-2200 Laser Particle Counter

Utilizing the principle of "near angle light scatter", a revolving laser beam passes through the walls of a glass container or a flow-thru cell. When it is directed through a central "sensitive zone" the PC-2200 not only counts the particles in suspension, but tabulates their size as well. The analog signals generated by the light pulses are routed to a computer and digitized. (read more)

More product announcements from Vindum Engineering, Inc.
Browse Vindum Engineering, Inc. Catalog
Browse Particle Size Analyzers and Particle Count Analyzers Datasheets for Vindum Engineering, Inc.
Ogura Industrial Corp. - No Contamination from Wear Particles
Ogura Industrial Corp.
No Contamination from Wear Particles

Since magnetic particle clutches/brakes are sealed, no wear particles can escape from the units, and because they are sealed there is minimal chance for contamination. This makes them extremely suited for medical, food, or other machinery where contamination could be an issue. (read more)

More product announcements from Ogura Industrial Corp.
Browse Ogura Industrial Corp. Catalog
Browse Electric Brake and Clutch Assemblies Datasheets for Ogura Industrial Corp.
Malvern Instruments, Inc. - Morphologi G2 - Particle Image Analyzer
Malvern Instruments, Inc.
Morphologi G2 - Particle Image Analyzer

Introducing the new Morphologi G2 high sensitivity particle image analyzer. Based upon digital image analysis and automated microscopy the Morphologi G2 is dedicated to measuring both particle size and particle shape. (read more)

More product announcements from Malvern Instruments, Inc.
Browse Malvern Instruments, Inc. Catalog
Browse Particle Size Analyzers and Particle Count Analyzers Datasheets for Malvern Instruments, Inc.
Malvern Instruments, Inc. - particle size & shape distributions - FPIA-3000
Malvern Instruments, Inc.
particle size & shape distributions - FPIA-3000

The Sysmex FPIA-3000 enables reliable, repeatable and routine characterization of particle size distributions and particle shape distributions using automated imaging techniques. Particle shape information is generated from the analysis of a large number of particles, displays of size and shape data are supported by images... (read more)

More product announcements from Malvern Instruments, Inc.
Browse Malvern Instruments, Inc. Catalog
Browse Particle Size Analyzers and Particle Count Analyzers Datasheets for Malvern Instruments, Inc.
Malvern Instruments, Inc. - Particle Measuring Dry Samples - Imaging
Malvern Instruments, Inc.
Particle Measuring Dry Samples - Imaging

Particle Measuring (Powders, Granules, etc.) from Malvern Instruments. Malvern has a wide range of systems for the characterizing the size of dry samples, powders or granules. Many materials across many branches of industry are produced as dry powders or granules. The stability, chemical reactivity, opacity, flowability and material strength of many materials are affected by... (read more)

More product announcements from Malvern Instruments, Inc.
Browse Malvern Instruments, Inc. Catalog
Browse Imaging Workstations Datasheets for Malvern Instruments, Inc.
MAGPOWR - "C" Series Magnetic Particle Clutches
MAGPOWR
"C" Series Magnetic Particle Clutches

Want easy to install, reliable, long lasting performance in a clutch? Then look no further. The MAGPOWR "C" Series Magnetic Particle Clutch is easy to install, made of rugged cast iron for long life and has minimal moving parts so you can mount the clutch, put it to work, and forget about it! (read more)

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Browse Electric Clutches Datasheets for MAGPOWR
Valtech Corporation - Custom Molded Ingot Support Beams
Valtech Corporation
Custom Molded Ingot Support Beams

The custom molded ingot support beams are used to mount silicon and various semiconductor and photovoltaic materials in preparation of inside diameter and wire saw wafering. The mounting beams are used in conjunction with the patented VALTRON® ingot mounting adhesive system to obtain optimal performance. (read more)

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Browse Resins and Compounds Datasheets for Valtech Corporation
RNDT, Inc. - Magnetic Particle Testing
RNDT, Inc.
Magnetic Particle Testing

Magnetic particle testing is done by inducing a magnetic field in a ferro-magnetic material and dusting the surface with iron particles (either dry or suspended in a liquid). Surface imperfections will allow the magnetic field to leak out of the part, distort the magnetic field and concentrate the iron particles near imperfections, thus indicating their presence. (read more)

More product announcements from RNDT, Inc.
Browse RNDT, Inc. Catalog
MSE - miniPCS™ Particle Counter & Sizer
MSE
miniPCS™ Particle Counter & Sizer

The miniPCS System is a self-contained, battery-operated Mie- scattering-based particle sizer and counter capable of measuring particles from 0.5 to 1000 μm in densities in excess of 10,000 per cubic centimeter. No external acquisition hardware is required; a computer is used simply as an interface to view the processed data output of the system. (read more)

More product announcements from MSE
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Other Topics You Might Be Interested In
The technique of laser diffraction relies on the fact that particles passing through a laser beam scatter light at an angle that is inversely proportional to their size (small particles scatter light... (Read More)
Scanning electron microscopy (SEM) may include failure analysis, material analysis, and the elemental analysis (EDS) of extremely small particles. SEMs are electron microscopes in which the image is... (Read More)
Dynamic light scattering or photon correlation spectroscopy (PCS) is used to determine the sizes of hydrodynamic particles by measuring the speed at which these particles diffuse in a base liquid. The... (Read More)
Examination of material cross sections often provides essential information about the crystal structure, layer or film thicknesses, existence of voids or cracks, and other properties that might impact... (Read More)
End-window transmission-target X-ray tubes are designed for very close anode-to-sample coupling for compact portable XRF instruments. Several recent improvements have been achieved to make these tubes... (Read More)

Tools & Useful Links for particle beam


Engineering Web: particle beam 1 - 10 of 989,181
PBPL Home Page
The Particle Beam Physics Laboratory (PBPL) is a state-of-the-art center for research into beam physics and accelerator technologies. Relativistic particle beams and the accelerators which produce ...
Howstuffworks "How Atom Smashers Work"
All particle accelerators, whether linacs or circular, have the following basic parts: *Particle source - provides the particles that will be accelerated *Copper tube - the particle beam travels in a ...
Howstuffworks "How Space Wars Will Work"
If a beam could be fired at those speeds, it would, for all intents and purposes, freeze the targeted object. A particle beam weapon would be able to generate power many times more destructive than ...
Neutral Particle Beam
... Particle Beam (NPB). A Neutral Particle Beam (NPB) weapon produces a beam of near-light-speed-neutral atomic particles by subjecting hydrogen or deuterium gas to an enormous electrical charge. The ...
Introducing the Particle-Beam Weapon
It has been theoretically calculated that specific threshold values of the beam parameters (beam current, particle energy, beam pulse length, etc.) are required for a beam to propagate through air ...
USGS: Science Topics: particle-beam spectroscopy
You are here: Methods > Laboratory methods > Chemical analysis. Help. Particle-beam spectroscopy. Analytical technique using a concentrated beam of charged subatomic particles.. Subtopics:. (none). ...
See U.S. Geological Survey Information
particle beam
... particle accelerator. Next Term: particle chamber. particle beam. Used for:. aerosol beam Broader Terms:. high energy particle Narrower Terms:. proton beam Scope Note:. focused beam of accelerated ...
Charged Particle Beam Group
The Charged Particle Beam Research Group (CPBG) is a member of the Institute for Research in Electronics and Applied Physics and involves faculty of Department of Electrical and Computer Engineering, ...
Howstuffworks "How Atom Smashers Work"
... is strengthened so that the particle beam accelerates with each consecutive pass. When the particles are at their highest or desired energy, a target is placed in the path of the beam, in or near the ...
Advanced Particle Beam Technologies for Nano Characterization and Fabrication
Advanced Particle Beam Technologies for Nano Characterization and Fabrication. May 12, 2005 By: J.J.L. Mulders et al., FEI Electron Optics. Nanotechnology developments focus on materials and life ...
See Nano Science and Technology Institute Information


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Related Keywords
pencil beam, plasma beam machining, radar beam, return beam vidicon, source system

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