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Product Categories for prober
Wafer and Thin Film Instrumentation -
(261 companies)
Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
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Automated Test Equipment -
(362 companies)
Automated test equipment (ATE) is used to monitor and control test and measurement devices, keeping human interaction at a minimum.
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Semiconductor Metrology Instruments -
(113 companies)
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.
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Product Announcements for prober
Product Announcements: 1 - 10 of 13
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Keithley Instruments, Inc.
INTEGRATED C-V MODULE AND SOFTWARE
KEITHLEY MAKES C-V/I-V/PULSE TESTING FASTER, SIMPLER, AND MORE ECONOMICAL WITH NEW INTEGRATED C-V MODULE AND SOFTWARE IN MARKET-LEADING 4200-SCS
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Keithley Instruments, Inc.
SOURCEMETER
KEITHLEY ADDS LOW CURRENT CAPABILITY TO SOURCEMETER LINE FOR FAST, COMPACT, AND ECONOMICAL PARAMETRIC TESTING
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SPEA America
4040 Multimode Flying Probe Tester
SPEA 4040 Multimode is an accurate and fast flying probe test system, ideal to test prototypes and pre-series as well as production volume boards. It can perform multi-function test (in-circuit, functional, optical, boundary scan, on board programming, and more) with a very high throughput.
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Temptronic Corporation
Cold Probing Upgrade
Temptronic can upgrade your existing probing station to add -55°C Moisture-free probing capability with their exclusive "Cold Probing Upgrade".
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Watlow
Thick Film Heaters on Ceramic
Thick film on aluminum nitride and alumina provide preferred heating elements resulting in temperature uniformity, quick response and stable physical properties.
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Heidenhain Corporation
LIF 400 Linear Encoder
Linear Encoder Advancements Make More Possible with Less
The photonics and semiconductor industries are very complex, and there is much interdependency. Machines related to both these industries (from fiber alignment stages to optical inspection systems) all have a few things in common despite th...
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Keithley Instruments, Inc.
ACS Integrated Test Systems
KEITHLEY ACS (Automated Characterization Suite) VERSION 3.2 OFFERS NEW PARALLEL TEST AND PARAMETRIC DIE SORT FEATURES FOR HIGHER THROUGHPUT
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Temptronic Corporation
Hood Style Environmental Test Chamber
Temptronic's unique compact hood enclosure is lowered over the UUT on a base or test surface to create a uniform, precise thermal test environment. Test cables are easily routed to the UUT around the entire periphery of the hood.
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Temptronic Corporation
Clamshell Style Environmental Test Chamber
The Clamshell Style ThermoChamber™ is a compact, extremely portable environmental test chamber that is ideal for bringing components, assemblies and other parts to temperature directly at the test site.
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Temptronic Corporation
Front Load Environmental Test Chamber
Fully portable, Temptronic's front load style ThermoChamber™ environmental test chamber provides a uniform, precise thermal test environment.
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Part Numbers for prober
| Part # |
Distributor |
Manufacturer |
Product Category |
Description |
| 35622 |
Newark |
DESCO
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Scribers
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Tools, Scriber Product Description:Nylon Soldering Prober, 6""5 long RoHS Compliant: NA |
| 35630 |
Newark |
DESCO
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Kits
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; Contents Of Kit:Stainless steel straight needle point prober, hook needle point prober, angle needle point prober , curved needle point prober and light blue vinyl storage pouch; For Use With:ESD Component Testing RoHS Compliant: NA |
Other Topics You Might Be Interested In
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Tools & Useful Links for prober
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Engineering Web: prober
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