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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find wafer inspection-related products, suppliers, datasheets and CAD.
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Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
Thin film equipment uses vacuum processing for the modification of surfaces using CVD, PVD, plasma etching, and thermal oxidation or ion implantation. Search by Specification | Learn More about Thin Film Equipment
Inspection services examine products, parts, equipment, repairs, services, installations, and facilities to ensure quality, consistency, and condition, as well as conformance to required standards and/or procedures. Search by Specification | Learn More about Inspection Services
Machine vision systems are used for automated inspection and measurement in production environments. Search by Specification | Learn More about Machine Vision Systems
Semiconductor equipment repair services repair, rebuild and refurbish equipment related to the manufacture and processing of semiconductors. Learn More about Semiconductor Equipment Repair Services
Specialty testing and inspection services provide specialized or proprietary testing services and inspection services. Learn More about Specialty Testing and Inspection Services
Construction and building inspection services include lab or field testing, analysis and monitoring of structures and building materials such as foundations, drainage systems, pavement, concrete, soils and reinforcing or structural steel. Search by Specification | Learn More about Construction and Building Inspection Services
Condition monitoring and machine maintenance services monitor the condition of critical machines, battery banks, power supplies, processes and rotary equipment. They also perform predictive maintenance (PdM) and/or preventive maintenance. Search by Specification | Learn More about Condition Monitoring and Machine Maintenance Services
RoHS testing and compliance services providers test a manufacturer's products for restricted or hazardous substances and certify compliance to RoHS or WEEE standards. Search by Specification | Learn More about RoHS Compliance and Testing Services
Frame grabbers are image processing computer boards that capture and store image data for industrial applications such as quality control. Search by Specification | Learn More about Frame Grabbers
Microscopes are instruments that produce magnified images of small objects Search by Specification | Learn More about Microscopes
Certification services include companies that test, inspect, register and/or certify products, components, equipment, instruments, processes, management systems or facilities. This area also includes organizations that evaluate, audit, assist, train and/or register companies on facility or system wide assessments such as ISO registration, process quality audits, health and safety assessment, and management systems evaluation. Search by Specification | Learn More about Certification Services
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More about Imaging Workstations
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More about Dimensional Measurement and Metrology Services
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Wafer Inspection Systems Olympus America Inc.
Wafer Measurement System MTI Instruments Inc.
Wafer Measurement System from MTI Instruments MTI Instruments Inc.
Thin Film Measurement System StellarNet, Inc.
MHV HD300 Vacuum Pump Metallurgical High Vacuum Corporation
VFD5D HP Regen Blower Fuji Electric RC Blowers and Pumps
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This machine uses high performance machine vision to inspect the precision alignment of small components attached to a silicon wafer. (read more)
Performing multiple tasks in a variety of ways is fundamental to today's semiconductor manufacturing environment.
Based on the above concept, Olympus has developed a Dual-Engine solution - an Inspection-Engine and an Analysis-Engine - to provide flexibility to respond to future needs as they evolve. This will allow the automation of inspection/analysis in the semiconductor field to...
(read more)
Inspect wafers that are bowed due to MEMS micro machining. Achieve 0.1 micron resolution, 3 Dimensional (3-D) metrology, and inspect both sides of the wafer simultaneously in a system that is SECS/GEM compliant and is compatible with Class 10 or above Clean Room Applications. (read more)
Solar Wafer Thickness Tool from MTI. The PV-1000 is a High speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials. (read more)
The Proforma 300 TM wafer thickness gage can be used to measure thickness, bow and TTV on all wafer materials including: silicon,gallium-arsenide,indium phosphide and germanium without recalibrating or electrically grounding the wafer. (read more)
The BLACKSTAR™ Series is a silicon dicing system utilizing a basic Fantom Laser Dicing Technology™ (FLDT™) invented and patented by Fonon Technology modified to accommodate the requirements of a composite wafer or PCB singulation process without affecting the existent dicing method, processes and procedures. (read more)
The Prior Scientific motorized Shuttle Stage is designed to be used with the Nikon and Olympus wafer loader systems for 3, 4, 6, and 8 inch wafers. The system greatly reduces operator fatigue while increasing inspection accuracy and repeatability. (read more)
Attach small, thin components to wafer with better than 1 micron accuracy, 99.9% quality, and self-inspection in 1.25 seconds.
This machine attaches small, thin components to the surface of a wafer using vision-guided servo control, 2 robots, a high performance stack of stages (X, Y, Theta), 4 vision cameras, and 2 vision boards. (read more)
An important part of their business at Dakota Riggers is providing inspections for the various rigging products that they sell their customers. Dakota performs hands-on inspections for wire rope slings, synthetic slings, cordage, alloy chains slings, lifting clamps, specialty lifting devices, and hand hoists. (read more)
The inspections performed by Non-Destructive Testing Group, Inc. (NDT Group) will assure that the equipment tested meets all state and federal safety codes, in addition to full compliance with inspection standards and recommendations. (read more)
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Wafer Inspection Systems on ThomasNet.com Inspection Systems Wafer Processing Systems Wafer Inspection Microscopes Video Inspection Systems Dimensional Inspection Systems Non-Contact See ThomasNet Information |
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Inspection System detects wafer edge defects., Bede inclusions, BedeScan(TM) defect inspection system is capable of looking at process induced defects on surface of wafer and detects crystallographic |
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Wafer Automated Inspection | Grinding and Dicing Services,... Full/Partial Wafer Inspection GDSI Full/Partial Wafer Inspection Automated inspection up to 400x the human eye for a clearer view. See Grinding & Dicing Services, Inc. Information |
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DWFritz Automation » Automated Wafer Inspection Automated Wafer Inspection The Automated Wafer Inspection tool accepts 150mm, 200mm, or The robot then moves the wafer to the inspection platform. See DWFritz Automation, Inc. Profile & Catalog |
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Untitled Wafer Inspection Systems Zoom Stereo Microscopes Wafer Inspection OEM Components Photomicrography See Olympus America Inc. Profile & Catalog |
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Wafer Inspection Microscopes, Semiconductor Test, UV Cameras, Wafer Handlers, Wafer Probes, Wafer Test, X-Ray Inspection, X-Ray Systems |
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Leica INS-1000 Wafer Inspection Microscope Leica INS-1000 Wafer Inspection Microscope : Search Results 1 - 3 of 3 listings for 'Leica INS-1000 Wafer Inspection Microscope' See LabX Information |
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High-resolution mask inspection at the wafer plane: SPIE... Wafer-plane inspection identifies defects in photolithography masks based on how they will print on the device wafer. |
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KLA Tencor | Home See KLA-Tencor Corporation Information |
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KLA Tencor | Product Releases | KLA-Tencor Wafer Inspection... KLA-Tencor Wafer Inspection Technology Speeds Ramp of 300 mm Production See KLA-Tencor Corporation Information |
