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Products/Services for wafer thickness measurement

<B>Wafer</B> and Thin Film Instrumentation
Wafer and Thin Film Instrumentation - (295 companies)

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation

Dimensional Gages and Instruments
Dimensional Gages and Instruments - (959 companies)

Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore. Search by Specification | Learn More about Dimensional Gages and Instruments

Nondestructive Testing (NDT) Material Testers
Nondestructive Testing (NDT) Material Testers - (111 companies)

...methods. Eddy current instruments induce detectable eddy currents in conductive materials, providing information for applications such as flaw detection, thickness determination, weld inspection, conductivity measurement, alloy sorting, and heat... Search by Specification | Learn More about Nondestructive Testing (NDT) Material Testers

<B>Measurement</B> Microphones
Measurement Microphones - (50 companies)

Measurement microphones are most commonly condenser microphones, which convert sound pressure to an output that is then converted into a reading such as sound pressure level (SPL). Search by Specification | Learn More about Measurement Microphones

Semiconductor Metrology Instruments
Semiconductor Metrology Instruments - (143 companies)

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system Search by Specification | Learn More about Semiconductor Metrology Instruments

Interferometers
Interferometers - (93 companies)

...that use HeNe lasers are used in alignment, recording, printing, and measurement applications. HeXe lasers use a mixture of helium and xenon. Interferometers also differ in terms of number of axes (single or multiple), orientation (vertical or horizontal... Search by Specification | Learn More about Interferometers

Air Gages
Air Gages - (92 companies)

...environments. Air metrology instruments can provide comparative or quantitative measurements such as thickness, depth, internal diameter (ID), outer diameter (OD), bore, taper and roundness. Air gauges and gaging systems may also use an indicator... Search by Specification | Learn More about Air Gages

Dimensional <B>Measurement</B> and Metrology Services
Dimensional Measurement and Metrology Services - (174 companies)

Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More about Dimensional Measurement and Metrology Services

Web Sensing and Scanning Systems
Web Sensing and Scanning Systems - (45 companies)

Web sensing systems and web scanning systems employ a variety of sensors that scan across a moving web to detect defects and measure parameters such as product basis weight, thickness and moisture. Learn More about Web Sensing and Scanning Systems

Humidity <B>Measurement</B> Instruments
Humidity Measurement Instruments - (446 companies)

Humidity measurement instruments test for absolute humidity, relative humidity, or dew point in air. Search by Specification | Learn More about Humidity Measurement Instruments

Semiconductors and Semiconductor Materials
Semiconductors and Semiconductor Materials - (224 companies)

Semiconductors (metalloids) or semiconductor materials are used to fabricate microelectronic and optoelectronic devices such as transistors, photodetectors or solar cells. Learn More about Semiconductors and Semiconductor Materials

Eddy Current Instruments
Eddy Current Instruments - (89 companies)

Eddy current instruments are nondestructive testing (NDT) devices that induce detectable eddy currents in conductive materials. They are used to detect flaws, determine thickness, inspect welds, measure conductivity, and sort alloys. Search by Specification | Learn More about Eddy Current Instruments

Nondestructive Testing (NDT) Equipment
Nondestructive Testing (NDT) Equipment - (832 companies)

...of instruments and systems. Examples include thickness gauges, flaw detectors, material condition testers, and eddy current instruments, as well as devices that measure conductivity, resistivity and corrosion. Some non-destructive testing (NDT... Search by Specification | Learn More about Nondestructive Testing (NDT) Equipment

Surface Profilometers
Surface Profilometers - (150 companies)

Although most surface profilometers provide only a two-dimensional (2D) or line file, some instruments can provide three-dimensional (3D) or areal topography measurements. Surface profilometers differ in terms of measurement capabilities... Search by Specification | Learn More about Surface Profilometers

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See more product announcements for Thickness Gages
Coating Gauges...

Coating Gauges...
Oxford Instruments / Industrial Analysis


DUALSCOPE® MP0 Coating Thickness Gauge

DUALSCOPE® MP0 Coating Thickness Gauge
Fischer Technology, Inc. / Coating Thickness Gages


Fischer Technology Coating Thickness Gauges

Fischer Technology Coating Thickness Gauges
Cygnus Instruments, Inc.


DUALSCOPE® FMP100 COATING THICKNESS GAUGE

DUALSCOPE® FMP100 COATING THICKNESS GAUGE
Fischer Technology, Inc. / Coating Thickness Gages


GCA/GCD Series Precision Gage Heads

GCA/GCD Series Precision Gage Heads
Measurement Specialties, Inc.


Coating Thickness Testers

Coating Thickness Testers
Kett US


11 See more product announcements for Thickness Gages

Product News for wafer thickness measurement

Fischer Technology, Inc. / Coating Thickness Gages
Copper Thickness Measurement - PHASCOPE PMP10

PHASCOPE® PMP10 measures copper coating thickness using phase-sensitive Eddy current method. It is a user-friendly instrument providing reproducible and accurate measurement of copper thickness on PC boards and metallic coatings on ferrous and non-ferrous metallic or electrically non-conductive parts. Depending on the probe it operates at the frequencies of 60 kHz, 240 kHz or 1.25 MHz. (read more)

Browse Thickness Gages Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
Fischer Technology, Inc. / Coating Thickness Gages
Copper Coating Thickness Measurement: SR-SCOPE®

Measurement of copper thickness on printed circuit boards. Non-destructive, fast, accurate, and without influence from opposing copper layers. (read more)

Browse Nondestructive Testing (NDT) Probes Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
MTI Instruments Inc.
Non-Contact Wafer Thickness Gage

The Proforma 300 TM wafer thickness gage can be used to measure thickness, bow and TTV on all wafer materials including: silicon,gallium-arsenide,indium phosphide and germanium without recalibrating or electrically grounding the wafer. (read more)

Browse Thickness Gages Datasheets for MTI Instruments Inc.
MTI Instruments Inc.
Solar Wafer Thickness Tool from MTI

Solar Wafer Thickness Tool from MTI. The PV-1000 is a High speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials. (read more)

Browse Thickness Gages Datasheets for MTI Instruments Inc.
MTI Instruments Inc.
Semiconductor Wafer Thickness Gage

Proforma 300/G - Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape. (read more)

Browse Thickness Gages Datasheets for MTI Instruments Inc.
Spectrum Instruments Ltd.
Corrosion Thickness Measurement Gauges

With more than 60 years of world-wide experience in ultrasonic designs, Danatronics is pleased to introduce our first line of portable, digital, hand-held ultrasonic thickness gauges; The EHC-O9 and EHC-09DL. The EHC series of ultrasonic thickness gauges are specifically designed to measure the remaining wall thickness of primarily steel structures. (read more)

Spectrum Instruments Ltd.
Precision Thickness Measurement Gauges

UPG-07 Color Wave Series with .0001" (.001MM) Decimal Resolution and live COLOR or Monochrome A-Scan. (read more)

MTI Instruments Inc.
Wafer Measurement System from MTI Instruments

Proforma 200SA - Semi-automated, full wafer surface scanning for thickness, TTV, bow, warp, site and global flatness. The Proforma 200SA can be used for all wafer materials and accommodates diameters 75 - 300 mm. (read more)

Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
MTI Instruments Inc.
Wafer Metrology Measurement Tool

The Proforma 300SA is a semi-automated tool for measuring wafer bow, warp, flatness and stress. (read more)

MTI Instruments Inc.
Wafer Measurement System

ProformaTM AutoScan 200 - Fully automated wafer characterization system for measuring thickness, TTV, bow, warp, bulk resistivity, site and global flatness. The Proforma AutoScan 200 features pick and place robotics, laser cassette scanning, auto-sensing cassette stands for wafers 75 - 200 mm diameter, and a modular design for easy upgrades. (read more)

Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
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Conduct Research

Engineering Web Search: wafer thickness measurement
MTI Instruments | Precision Instruments | Non-contact...
We also offer wafer thickness gaging instruments, noncontact gages and displacement probes and sensors for edge and repetitive and nonrepetitive
Automated Semiconductor Wafer Sorting Using NI LabVIEW...
Measuring the bow, warp, and TTV of a wafer requires performing a full dimensional measurement scan of the wafer top and bottom surfaces.
MEMS Calculator
or fixed-fixed beams, and a material test machine is used to obtain the wafer bond strength from micro-chevron test structures.
See Electronics and Electrical Engineering Laboratory Information
Prometrix FT-700 Wafer Film Thickness Measurement-Surplus...
>> Prometrix FT-700 Wafer Film Thickness Measurement Category >> New Arrivals >> Prometrix FT-700 Wafer Film Thickness Measurement Prometrix FT-700
See SPEC Equipment - Surplus Process Equipment Corporation Information
SEMI P27-96 (Reapproved 0703) Parameter Checklist for...

SEMI MF576-0706 Test Method for Measurement of Insulator...

In-line FTIR for epitaxial silicon film thickness measurement...
In-line FTIR for epitaxial silicon film thickness measurement on an Applied Materials Centura cluster tool
In-situ film thickness and temperature monitoring using a 2...
IEEE 1991 Item Title: In-situ film thickness and temperature monitoring using a 2 GHz acoustic phase measurement system Publisher Name: IEEE
Spectrophotometric film thickness measurement: View
Spectrophotometric film thickness measurement: View Spectrophotometric film thickness measurement
See MEMS and Nanotechnology Exchange Information
Spectrophotometric film thickness measurement: View
Spectrophotometric film thickness measurement: View Spectrophotometric film thickness measurement
See MEMS and Nanotechnology Exchange Information

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