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About Surface Profilometers
Surface profilometers are used to measures surface profiles, roughness, waviness and other finish parameters. They are similar to form gages, inspection tools that are used to measure surface profile, roughness, waviness, and other finish parameters. There are two basic surface profilometer technologies: contact and non-contact. Contact or stylus-based surface profilometers measure surface texture by dragging a sharp, pointed tool across the surface. Height variations of the tip are recorded and then used to form a texture profile. Roughness and waviness are also calculated from the surface profile data. Non-contact surface profilometers measure the surface texture by optically scanning a surface with a light or laser. Optical or light-based instruments may also use triangulation or interferometry to measure or capture a surface profile. Although most surface profilometers provide only a two-dimensional (2D) or line file, some instruments can provide three-dimensional (3D) or areal topography measurements.
Surface profilometers differ in terms of measurement capabilities and common specific parameters. Choices for measurement capabilities include: roughness, spacing, waviness, and hybrid parameters; automatic defect classification (ADC); flatness, thickness, and step height; lay or pattern; and warp or bow. There are many common specific parameters for surface profilometers. Examples include: roughness average, mean peak-to-valley height, base roughness depth, maximum peak height, average peak profile height, maximum valley depth, total roughness height, profile depth, maximum roughness depth, and ten-point height. Other choices for common specific parameters include: skewness, kurtosis, waviness average, waviness height, peak count, peak spacing average, core roughness depth, bearing ratio, and slope. There are two different slope measurements: Slope Ra and Slope Rq. Slope Ra or Delta a is a measure of the slope of the average profile within the sample length. Slope Rq or Delta Rq is a measure of the root mean square (RMS) slope of the profile within the sample length.
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Engineering Web: Surface Profilometers
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