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MTI Instruments Inc.
325 Washington Avenue Extension
Albany, NY 12205
USA
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Web site
E-mail Company
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Phone:
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(518) 218-2550
(800) 342-2203
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Fax:
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(518) 218-2506
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Business Type:
Manufacturer
MTI Instruments has been at the forefront of high-precision,
noncontact measurement for more than 30 years. They offer fiber-optic, capacitive, and laser technologies designed to measure position, displacement, and vibration in the production process and in the laboratory.
MTI specializes in providing in-depth technical support before, during and after the sale. Their staff of application engineers and worldwide network of factory-trained representatives are ready to answer your questions and solve your measurement needs.
Pioneers in Noncontact Measurement
EVE - Stand-alone measurement and data management system, compatible with virtually any sensor input.
- Microtrak II - CMOS laser triangulation sensor for most materials and surfaces with a frequency response to 20 kHz.
- Microtrak II Stand Alone Laserhead - High-speed laser sensors designed to operate independently without a controller. For high volume OEM, production and QC applications.
- Microtrak 7000 - Single or dual channel, high resolution laser displacement sensor.
- MTI-2100 Fotonic Sensor - Fiber-optic vibration sensor for measurements up to 500 kHz.
- Accumeasure Microcap Board - Custom OEM configurations of MTII’s latest capacitance amplifier design.
- Accumeasure 5000 - High frequency single or dual channel capacitance system.
- Accumeasure 9000 - High-resolution capacitance sensor with outstanding resolution, accuracy and stability.
- Accumeasure 1500 - Multi-channel capacitance gaging system.
- Accumeasure 500 - Compact 6-channel capacitance system designed for brake rotor and other compact multi-channel applications.
- Proforma 300 - Manual thickness gage for conductive, semiconducting and semi-insulating materials.
- Proforma 200SA - Semi-automated thickness gage with powerful software for analysis of wafer bow, warp, thickness and flatness.
- AutoScan 200 - Fully automated, cassette-to-cassette wafer inspection system for semiconducting and semi-insulating wafers.
- PV-1000 - High-speed wafer thickness measurement system for photovoltaic production applications.
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