| Product Name |
Notes |
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PicoForce
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Accuracy & flexibility for molecular biology & nanoscale materials research
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Optical Profiling System -- Wyko SP9900
|
Automated, non-contact 3D inspection for production-boosting performance
|
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EnviroScope AFM
|
Can add vacuum,gas, liquid, heating to observe sample environmental changes
|
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Dimension 5000 SPM
|
Capable of measuring up to 100 areas on samples up to 350mm in diameter
|
|
Optical Profiling System -- Wyko NT9800
|
Continuously self-calibrating scanner for highest accuracy
|
|
Optical Profiling System -- Wyko DMEMS NT1100
|
Dynamic and static MEMS metrology on a single system
|
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InSight 3DAFM
|
Fully automated AFM system, provides fastest throughput of any AFM today
|
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Dimension AFP
|
Fully automated AFP, perfect for many FEOL and BEOL applications
|
|
Dimension Vx210/310 AFP
|
Has AFM resolution, long scan capability,high vertical & lateral resolution
|
|
Innova SPM
|
High resolution closed-loop system; fas, easy tip and sample exchange
|
|
Surface Profiler -- Dektak 150
|
High-performance versatility and value
|
|
Caliber SPM
|
Ideal entry level instrument for research or industrial labs
|
|
Electrochemical SPM Scanning Probe Scope
|
Includes ECSTM, ECAFM, SECPM, in-situ imaging with nano-scale resolution
|
|
Dimension 3100
|
Low noise performance, images small and large specimens in liquid or air
|
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Surface Profiler -- Dektak 8
|
Low-force sensor technology for scratch-free measurement of soft materials
|
|
Optical Profiling System -- Wyko DMEMS NT3300
|
Measure in-plane and out-of-plane dimensions of MEMS motion
|
|
MultiMode V
|
Modular design/environmental control, uses AFM and STM techniques
|
|
Optical Profiling System -- Wyko NT9100,
Optical Profiling System -- Wyko NT9300
|
Motorized, programmable stage, comprehensive Vision® analysis software
|
|
Dimension Vx200/300 AFP
|
Offers non-destructive profiling for CMP control, semi-automated platform
|
|
BioScope II Atomic Force Microscope
|
Open optical and physical access,easy access and manipulation of tip/sample
|
|
Dimension X3D for Data Storage
|
Provides 3D metrology for 3D PMR structures and trenches, non-destructive
|
|
BioScope SZ Atomic Force Microscope
|
Provides 10^2 magnification beyond standard optical microscopy
|
|
Dimension X
|
Reduces etch measurement turnaround from days to mins, non-destructive
|
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Optical Profiling System -- Wyko HD8100
|
Self-calibration with internal reference signal, good vibration isolation
|
|
Wyko Optical Metrology Module
|
Stand-alone module, non-contact, gauge-capable metrology
|
|
Dimension V SPM
|
State of the art closed-loop XYZ scanner, modular design for broad app. set
|
|
Dimension X3D Photomask
|
Superior repeatability, high resolution, non-destructive
|
|
NanoMan VS
|
Unmatched scanning performance, advanced software capabilities
|
|
MultiMode
|
World's best selling SPM, easily gets data on micro- to atomic-scale images
|