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Veeco Instruments Data Sheets for Surface Profilometers

Veeco Instruments
Address: Terminal Drive
Plainview, NY 11803
Contact: Web site
E-mail

Phone:  (805) 967-1400
(888) 248-3326
Fax: (805) 967-7717

Surface Profilometers:

Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.

Learn more about Surface Profilometers

Product Name
Notes
PicoForce Accuracy & flexibility for molecular biology & nanoscale materials research
Optical Profiling System -- Wyko SP9900 Automated, non-contact 3D inspection for production-boosting performance
EnviroScope AFM Can add vacuum,gas, liquid, heating to observe sample environmental changes
Dimension 5000 SPM Capable of measuring up to 100 areas on samples up to 350mm in diameter
Optical Profiling System -- Wyko NT9800 Continuously self-calibrating scanner for highest accuracy
Optical Profiling System -- Wyko DMEMS NT1100 Dynamic and static MEMS metrology on a single system
InSight 3DAFM Fully automated AFM system, provides fastest throughput of any AFM today
Dimension AFP Fully automated AFP, perfect for many FEOL and BEOL applications
Dimension Vx210/310 AFP Has AFM resolution, long scan capability,high vertical & lateral resolution
Innova SPM High resolution closed-loop system; fas, easy tip and sample exchange
Surface Profiler -- Dektak 150 High-performance versatility and value
Caliber SPM Ideal entry level instrument for research or industrial labs
Electrochemical SPM Scanning Probe Scope Includes ECSTM, ECAFM, SECPM, in-situ imaging with nano-scale resolution
Dimension 3100 Low noise performance, images small and large specimens in liquid or air
Surface Profiler -- Dektak 8 Low-force sensor technology for scratch-free measurement of soft materials
Optical Profiling System -- Wyko DMEMS NT3300 Measure in-plane and out-of-plane dimensions of MEMS motion
MultiMode V Modular design/environmental control, uses AFM and STM techniques
Optical Profiling System -- Wyko NT9100, Optical Profiling System -- Wyko NT9300 Motorized, programmable stage, comprehensive Vision® analysis software
Dimension Vx200/300 AFP Offers non-destructive profiling for CMP control, semi-automated platform
BioScope II Atomic Force Microscope Open optical and physical access,easy access and manipulation of tip/sample
Dimension X3D for Data Storage Provides 3D metrology for 3D PMR structures and trenches, non-destructive
BioScope SZ Atomic Force Microscope Provides 10^2 magnification beyond standard optical microscopy
Dimension X Reduces etch measurement turnaround from days to mins, non-destructive
Optical Profiling System -- Wyko HD8100 Self-calibration with internal reference signal, good vibration isolation
Wyko Optical Metrology Module Stand-alone module, non-contact, gauge-capable metrology
Dimension V SPM State of the art closed-loop XYZ scanner, modular design for broad app. set
Dimension X3D Photomask Superior repeatability, high resolution, non-destructive
NanoMan VS Unmatched scanning performance, advanced software capabilities
MultiMode World's best selling SPM, easily gets data on micro- to atomic-scale images
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  • Company Description:
    Veeco is a leading provider of Metrology and Process Equipment solutions used by manufacturers in the data storage, semiconductor, wireless, lighting and solar industries. These industries help create a wide range of information age technology and products, such as portable music players, cell... (more)