| Product Name |
Notes |
|
Accumeasure 9000 -- ASP-5-PCR
|
Real-time measurements, exceptional temperature stability, pancake radial
|
|
Accumeasure 9000 -- ASP-50-CTA
|
Real-time measurements, exceptional temperature stability, axial connector
|
|
Accumeasure 9000 -- ASP-50-ILA
|
Real-time measurements, exceptional temperature stability, lead axial
|
|
Accumeasure 9000 -- ASP-50-ILR
|
Real-time measurements, exceptional temperature stability, radial lead
|
|
Accumeasure 9000 -- ASP-50-PCR
|
Real-time measurements, exceptional temperature stability, pancake radial
|
|
Microtrak 7000 -- MT-100-20
|
Available with single/dual laser heads, high 100kHz sampling, visible laser
|
|
Microtrak 7000 -- MT-100-5
|
Available with single/dual laser heads, high 100kHz sampling, visible laser
|
|
Microtrak 7000 -- MT-250-200
|
Available with single/dual laser heads, high 100kHz sampling, visible laser
|
|
Microtrak 7000 -- MT-250-400
|
Available with single/dual laser heads, high 100kHz sampling, visible laser
|
|
Microtrak 7000 -- MT-600-1600
|
Available with single/dual laser heads, high 100kHz sampling, visible laser
|
|
Microtrak 7000 -- MT-600-3000
|
Available with single/dual laser heads, high 100kHz sampling, visible laser
|
|
Microtrak 7000 -- MT-600-800
|
Available with single/dual laser heads, high 100kHz sampling, visible laser
|
|
Microtrak II -- LTC-025-002
|
9ft laser cable, measures vibration, step height, thermal expansion
|
|
Microtrak II -- LTC-025-004
|
9ft laser cable, measures vibration, step height, thermal expansion
|
|
Microtrak II -- LTC-050-010
|
9ft laser cable, measures vibration, step height, thermal expansion
|
|
Microtrak II -- LTC-050-020
|
9ft laser cable, measures vibration, step height, thermal expansion
|
|
Microtrak II -- LTC-120-20
|
9ft laser cable, measures vibration, step height, thermal expansion
|
|
Microtrak II -- LTC-120-40
|
9ft laser cable, measures vibration, step height, thermal expansion
|
|
Semiconductor Products -- Proforma 200SA
|
Non-Contact, SEMI/ASTM standard measurements, Window® interface
|
|
Semiconductor Products -- Proforma 300
|
Measures TTV, 5 ms response time, no need to electrically ground the wafer
|
|
Semiconductor Products -- Proforma 300SA
|
Measures TTV, P or N type conductivity, no need to connect ground the wafer
|
|
Semiconductor Products -- Proforma AutoScan 200
|
3-dimensional imaging, Windows NT® operating system, 75-200mm diameter
|
|
Spindle Runout Test System -- AS.5000.SRT
|
Repetitive high precision and high speed measurement of spindle runout
|