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Wafer and Thin Film Instrumentation Data Sheets

Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.

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Wafer and Thin Film Instrumentation DataSheets From:	Headquarters
CeramTec North America	Laurens, SC
Edwards Vacuum	United Kingdom
Jordan Valley APD	Austin, TX
Keithley Instruments, Inc.	Solon, OH
MKS Instruments, Inc.	Wilmington, MA
MTI Instruments Inc.	Albany, NY
MTS Nano Instruments	Oak Ridge, TN
Nikon Instruments Inc.	Melville, NY
Nor-Cal Products, Inc.	Yreka, CA
Olympus Surgical & Industrial America, Inc.	Orangeburg, NY
Piezocryst Advanced Sensorics GmbH	Austria
ULVAC Technologies, Inc.	Methuen, MA
Zygo Corporation	Middlefield, CT

View Wafer and Thin Film Instrumentation Suppliers by State

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