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Wafer and Thin Film Instrumentation Data Sheets

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
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Wafer and Thin Film Instrumentation DataSheets From: Headquarters  
Agilent Technologies / Nanomechanical Instruments Chandler, AZ  
CeramTec North America Laurens, SC  
Hiden Analytical Livonia, MI  
Imego Sweden  
MKS Instruments, Inc. Andover, MA  
MTI Instruments Inc. Albany, NY  
Nikon Instruments Inc. Melville, NY  
Olympus America Inc. Center Valley, PA  
Polytec, Inc. Irvine, CA  
TELOPS, Inc. Canada  
Veeco Instruments Plainview, NY  
WDI Wise Device Inc. Canada  
Xenemetrix Inc. (Formerly Jordan Valley AR Inc.) Austin, TX  


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