| Form Factor |
Sensor or sensing element |
| Mounting / Loading |
In-process, in-situ or system mounted |
| Technology |
Quartz crystal microbalance |
| Applications |
Wafer (optional feature); Memory drive disc or head (optional feature); CVD / PVD; Optical components or lenses (optional feature); Etching (optional feature) |
| Measurements |
Deposition rate; FilmThickness |
| Notes |
Replacement crystals for thin film deposition monitoring systems |
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| View Entire Datasheet |
