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Nikon Instruments Inc. Data Sheets for Wafer and Thin Film Instrumentation


Nikon Instruments Inc.
Address: 1300 Walt Whitman Road
Melville, NY 11747-3064
 Contact: Web site
E-mail

Phone:  (631) 547-4200
(800) 52-Nikon
Fax: (631) 547-0299
Wafer and Thin Film Instrumentation:
Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Learn more about Wafer and Thin Film Instrumentation.

Product Name Notes
Automatic Macro Inspection System -- AMI-2000 Automatic macro inspection system, high detection sensitivity
Automatic Macro Inspection System -- AMI-3000 High throughput, automatic inspection to eliminate user subjectivity
IC Wafer Inspection System -- Optistation V Flexible design, allows for open cassette or SMIF applications
Overlay Measurement System -- NRM-3000 Overlay measurement system, active vibration-absorption stage
Overlay Measurement System -- NRM-3100 Waferless recipe creation, high precision optics for overlay measurement
Wafer Carrier Measuring System -- VMR-C4540 FOUP, FOSB, OC compatible carriers, episcopic, diascopic, darkfield
Wafer Inspection System -- Optistation 7 IC Dual feeder arm transfer unit offers high throughput, non-contact alignment
Wafer Inspection System -- Optistation-3100 Easy operation, contamination free wafer inspection system
Wafer Inspection System -- Optistation-3200 Optional defect review station, high N.A. w/ longer working distances
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Company Description
A multi-billion dollar precision optical company, that is regarded as one of the most respected brands in the world. Nikon is a global leader in the development of advanced optical technology. Its product line includes microscopy equipment, digital imaging, precision measuring and semiconductor... (more)

Other Datasheet Catalogs for Nikon Instruments Inc.
Biological Microscopes, Coordinate Measuring Machines (CMM), Digital and Video Microscopes, Dimensional and Profile Scanners, Imaging Workstations, Machine Vision Systems, Measuring Microscopes, Metallurgical Microscopes, Microscopes, All Types, Optical and Light Microscopes, Optical Comparators, Semiconductor Metrology Instruments, Specialty Microscopes

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