| Product Name |
Notes |
|
Wafer Inspection System -- MX51
|
Fast, accurate detection of defects, motorized nosepiece available
|
|
Wafer Inspection System -- MX61
|
Space saving, ergonomic design, ready for digital imaging
|
|
Wafer Inspection System -- MX61L
|
Space saving, ergonomic design, ready for digital imaging
|
|
Wafer Inspection System -- MX80
|
Vibration resistant, sealed drive unit, precise laser tracking auto focus
|
|
Wafer Inspection System Autoloader -- AL110-4
|
High throughput, class 10 compatible, 100% backside inspection
|
|
Wafer Inspection System Autoloader -- AL110-5
|
High throughput, class 10 compatible, 100% backside inspection
|
|
Wafer Inspection System Autoloader -- AL110-6
|
High throughput, class 10 compatible, 100% backside inspection
|
|
Wafer Inspection System Autoloader -- AL110-8
|
High throughput, class 10 compatible, 100% backside inspection
|
|
Wafer Inspection System Autoloader -- AL110-86
|
High throughput, class 10 compatible, 100% backside inspection
|