Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Founded in Japan in 1952, ULVAC is an international corporation that designs, manufacturers and markets equipment and materials for industrial applications of vacuum technology. Today, ULVAC is a leading global supplier of production systems, instrumentation, pumps and vacuum components used in the... (more)
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