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MTI Instruments Inc. Data Sheets for Wafer and Thin Film Instrumentation

Address:

325 Washington Avenue Extension
Albany, NY 12205

Contact:

Web site
E-mail

Phone:	(518) 218-2550 (800) 342-2203
Fax:	(518) 218-2506

Wafer and Thin Film Instrumentation:

Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.

Learn more about Wafer and Thin Film Instrumentation.

Product Name	Notes
Semiconductor Products -- AutoScan 300	Wafer/part size (mm): 75, 100, 125, 150, 200
Semiconductor Products -- Proforma™ 200SA	Wafer/part size (mm): 75, 100, 125, 150, 200
Semiconductor Products -- Proforma™ 300	Wafer/part size (mm): 50, 75, 100, 125, 150, 200, 300
Semiconductor Products -- Proforma™ 300SA	Wafer/part size (mm): 150, 200, 300
Semiconductor Products -- Proforma™ AutoScan 200	Wafer/part size (mm): 75, 100, 125, 150, 200

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Company Description
MTI Instruments has been at the forefront of high-precision, noncontact measurement for more than 30 years. They offer fiber-optic, capacitive, laser and eddy current technologies designed to measure position, displacement, and vibration in the production process and in the laboratory. MTI... (more)

Other Datasheet Catalogs for MTI Instruments Inc.

Calibration Instruments, Dimensional Gages and Instruments, Eddy Current Probes, Flaw Detectors, Form Gages and Form Gaging Systems, Height Gages, Linear Position Sensors, All Types, Linear Position Sensors, Capacitive, Linear Position Sensors, Fiber Optic, Nondestructive Testing (NDT) Equipment, Plug and Pin Gages, Position Probes, Position Sensors, Optical Triangulation, Surface Metrology Equipment, Surface Profilometers, Thickness Gages, Vibration Instruments

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