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MTI Instruments Inc. Data Sheets for Surface Metrology Equipment


MTI Instruments Inc.
Address: 325 Washington Avenue Extension
Albany, NY 12205
Contact: Web site
E-mail

Phone:  (518) 218-2550
(800) 342-2203
Fax: (518) 218-2506
Surface Metrology Equipment:
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects.
Learn more about Surface Metrology Equipment.

Product Name Notes
MTI-2100 Fotonic -- MTI-2020R Optical peak range:9.5 to 14.5 mil, second range:14 to 26 mil
MTI-2100 Fotonic -- MTI-2032R Optical peak range:17.5 to 22.5 mil, second range:20.5 to 49.5 mil
MTI-2100 Fotonic -- MTI-2032RX Optical peak range:4.25 to 5.75 mil, second range:1.3 to 1.7 mil
MTI-2100 Fotonic -- MTI-2047R Optical peak range:15.5 to 20.5 mil, second range:24 to 64 mil
MTI-2100 Fotonic -- MTI-2062H Optical peak range:93 to 107 mil, second range:112.5 to 187.5 mil
MTI-2100 Fotonic -- MTI-2062R Optical peak range:23.5 to 30.5 mil, second range:40 to 100 mil
MTI-2100 Fotonic -- MTI-2125CTI Optical peak range:90 to 110 mil, second range:150 to 290 mil
MTI-2100 Fotonic -- MTI-2125H Optical peak range:155 to 205 mil, second range:212.5 to 387.5 mil
MTI-2100 Fotonic -- MTI-2125R Optical peak range:25 to 39 mil, second range:50 to 190 mil
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Company Description
MTI Instruments has been at the forefront of high-precision, noncontact measurement for more than 30 years. They offer fiber-optic, capacitive, and laser technologies designed to measure position, displacement, and vibration in the production process and in the laboratory.
MTI specializes in... (more)

Other Datasheet Catalogs for MTI Instruments Inc.
Calibration Instruments, Dimensional Gages and Instruments, Flaw Detectors, Form Gages and Form Gaging Systems, Height Gages, Linear Position Sensors, All Types, Linear Position Sensors, Capacitive, Linear Position Sensors, Fiber Optic, Nondestructive Testing (NDT) Equipment, Plug and Pin Gages, Position Probes, Position Sensors, Optical Triangulation, Semiconductor Metrology Instruments, Surface Profilometers, Thickness Gages, Vibration Instruments, Wafer and Thin Film Instrumentation



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