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Nikon Instruments Inc. Data Sheets for Dimensional and Profile Scanners


Nikon Instruments Inc.
Address: 1300 Walt Whitman Road
Melville, NY 11747-3064
Contact: Web site
E-mail

Phone:  (631) 547-4200
(800) 52-Nikon
Fax: (631) 547-0299
Dimensional and Profile Scanners:
Dimensional and profile scanners gather two-dimensional (2D) or three-dimensional (3D) information about an object.
Learn more about Dimensional and Profile Scanners.

Product Name Notes
Digital Imaging & Metrology -- iNEXIV VMA-2520 For mechanical parts, electronic devices, dies & molds and medical devices
NEXIV -- VMR-10080 Non-contact auto measuring system, U2-compliant, higher accuracy available
NEXIV -- VMR-10080 Z120X Non-contact auto measuring system, U2-compliant, 120X max. magnification
NEXIV -- VMR-3020 Dual ring programmable oblique LED rings with 8 independent segments
NEXIV -- VMR-3020 Z120X 120X max. magnification, darkfield illumination, episcopic, diascopic
NEXIV -- VMR-6555 Dual ring programmable oblique LED rings w/8 independent segments
NEXIV -- VMR-6555 Z120X Dual ring LED rings w/8 independent segments, 120x max magnification module
NEXIV Ultra High Precision -- VMR-H3030 V-flat stage guide, vision auto focus, user selectable edge detection
NEXIV Ultra High Precision -- VMR-H3030 Z120X 120X max. magnification, evaluated cross sections, wafer level CSP
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Company Description
A multi-billion dollar precision optical company, that is regarded as one of the most respected brands in the world. Nikon is a global leader in the development of advanced optical technology. Its product line includes microscopy equipment, digital imaging, precision measuring and semiconductor... (more)

Other Datasheet Catalogs for Nikon Instruments Inc.
Biological Microscopes, Coordinate Measuring Machines (CMM), Digital and Video Microscopes, Imaging Workstations, Machine Vision Systems, Measuring Microscopes, Metallurgical Microscopes, Microscopes, Optical and Light Microscopes, Optical Comparators, Semiconductor Metrology Instruments, Specialty Microscopes, Wafer and Thin Film Instrumentation