MTI Instruments Inc. - Product Announcements

EVE is a stand alone measurement solution and data acquisition system combining incredible power, amazing simplicity and unlimited versatility. It features a graphical touch screen interface, 8 configurable analog input channels, 8 digital I/O channels and intuitive user software. (read more)

The Accumeasure MicroCap is a compact, custom designed, OEM capacitance system for high-precision non-contact measurement. It provides exceptional value and offers sub-nanometer resolution, extremely high stability and fast response time, making it ideal for micro-positioning, thermal correction, focusing and closed loop control applications. (read more)

Laser Sensor Displacement & Position Measurements from MTI Instruments.

The Microtrak II features state-of-the-art CMOS laser triangulation sensing technology for precise measurements of displacement, position, vibration and thickness. (read more)

High speed laser sensors designed to operate independently without a controller; for high volume OEM, production of QC applications. (read more)

The Accumeasure 9000 is a compact single or dual channel capacitance based position, displacement and vibration sensor with nanometer accuracy. The 9000D provides the same features as the 9000, but with addition of a digital display. (read more)

The Accumeasure 1500 is a multi-channel capacitance based position, displacement and vibration sensor with exception resolution and accuracy. It is capable of accepting up to 10 channels and includes a digital display and summing amplifiers for thickness measurements. (read more)

The Accumeasure 500 is a compact 6-channel capacitance system designed for breake rotor and other compact, multi-channel applications. (read more)

November 28, 2007 - MTII is discontinuing the Microtrak 7000. The new and improved Microtrak II Laser Triangulation product line offers significant improvements in vibration and displacement measurement technology, and at a substantially lower cost. Please visit the links for the Microtrak II and Microtrak II Stand Alone Laser for further information. (read more)

MTI-2000 Fotonic Sensor is a non-contact displacement, vibration and position sensor using state-of-the -art fiber optic technology. (read more)

High-precision, noncontact capacitance displacement and vibration measurement system with nanometer accuracy (read more)

MTI-2100 Fotonic Sensor is an advanced fiber-optic non-contact displacement, vibration and position sensor for a wide variety of applications. (read more)

1500CS is a hand-held precision instrument that generates voltage and charge signals over a wide frequency range. With 2 digitally synthesized channels, the 1500CS has the accuracy and flexibility to test all types of measurement systems. Its high accuracy makes it ideal for the bench. Its small and rugged size make it ideal for field use. (read more)

The APEX series of eddy current and inductive sensors provide measurement solutions for demanding process control and condition based monitoring applications. A wide variety of standard and custom designed probes are available with measurement ranges to 50 mm at frequency response to 10 kHz. (read more)

Proforma 300/G - Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape. (read more)

Proforma 200SA - Semi-automated, full wafer surface scanning for thickness, TTV, bow, warp, site and global flatness. The Proforma 200SA can be used for all wafer materials and accommodates diameters 75 - 300 mm. (read more)

Proforma^TM AutoScan 200 - Fully automated wafer characterization system for measuring thickness, TTV, bow, warp, bulk resistivity, site and global flatness. The Proforma AutoScan 200 features pick and place robotics, laser cassette scanning, auto-sensing cassette stands for wafers 75 - 200 mm diameter, and a modular design for easy upgrades. (read more)

The Proforma 300 TM wafer thickness gage can be used to measure thickness, bow and TTV on all wafer materials including: silicon,gallium-arsenide,indium phosphide and germanium without recalibrating or electrically grounding the wafer. (read more)

The Proforma 300SA is a semi-automated tool for measuring wafer bow, warp, flatness and stress. (read more)

An easily portable system designed for on-wing or test cell use, with both engine trim balance and vibration analysis features (read more)

The PBS-4100R Series II is an OEM version of the popular PBS-4100R system for test cell vibration analysis and trim balancing. (read more)

A complete vibration analysis and trim balancing system designed specifically for test cell applications (read more)

The TSC-4100R Tachometer Signal Conditioner can be used in engine test cells, or for on-wing applications where a 1/revolution signal is required for engine balancing. For engines with a multi-tooth speed sensor with an "imbedded" 1/rev pulse, the TSC-4100R automatically discriminates the long, short, narrow, or wide tooth and generates a discrete balance reference signal at that location. (read more)

The CA1800 Charge Amplifier System is used to condition and amplify charge-mode accelerometer signals. It is a rugged, rack-mountable instrument for use in engine test cell control rooms and other environments where charge-mode accelerometers are used to measure machinery vibration. (read more)